LIV. On the long-wave limits of the normal photoelectric effect

1914 ◽  
Vol 27 (159) ◽  
pp. 473-475 ◽  
Keyword(s):  
Photoelectric Effect ◽  
Long Wave

World Economic Crisis as a Process of Substitution of Technological Modes

2009 ◽  
pp. 26-38 ◽  
Author(s):  
S. Glaziev
Keyword(s):  
Economic Crisis ◽  
Economic Activity ◽  
Sharp Increase ◽  
Energy Resources ◽  
Long Wave ◽  
The World ◽  
World Economic ◽  
Technological Mode ◽  
World Economic Crisis

The article analyzes fundamental reasons for the world economic crisis in the light of global technological shifts. It proves that it is caused by the substitution of technological modes. It is shown that sharp increase and slump in stock indices and prices for energy resources are typical of the process of technological substitution which occurs regularly according to the rhythm of long-wave fluctuations of the world economic activity. The article rationalizes a package of anti-crisis measures aimed at stimulating the new technological mode. Its structure and role of the locomotive factor of the new long wave of economic growth are revealed.

RxCADRE 2008: Wildfire Airborne Sensor Program - Lite uncalibrated long wave infrared image mosaics

2016 ◽  
Author(s):  
Andrew T. Hudak ◽  
Benjamin C. Bright ◽  
Robert L. Kremens ◽  
Matthew B. Dickinson ◽  
Matthew G. Alden
Keyword(s):  
Infrared Image ◽  
Long Wave ◽  
Long Wave Infrared

A Study of the Photoelectric Effect Caused by a Laser Beam Used in a Beam Bounce Technique in a C-AFM System

2008 ◽  
Author(s):  
Hung-Sung Lin ◽  
Mong-Sheng Wu
Keyword(s):  
Laser Beam ◽  
Failure Analysis ◽  
Atomic Force Microscope ◽  
Photoelectric Effect ◽  
Scanning Probe ◽  
Nanometer Scale ◽  
Electrical Characteristics ◽  
Atomic Force ◽  
Probe Microscope ◽  
Probe Head

Abstract The use of a scanning probe microscope (SPM), such as a conductive atomic force microscope (C-AFM) has been widely reported as a method of failure analysis in nanometer scale science and technology [1-6]. A beam bounce technique is usually used to enable the probe head to measure extremely small movements of the cantilever as it is moved across the surface of the sample. However, the laser beam used for a beam bounce also gives rise to the photoelectric effect while we are measuring the electrical characteristics of a device, such as a pn junction. In this paper, the photocurrent for a device caused by photon illumination was quantitatively evaluated. In addition, this paper also presents an example of an application of the C-AFM as a tool for the failure analysis of trap defects by taking advantage of the photoelectric effect.

Digital economy: conceptual and strategic aspects of development

2020 ◽  
pp. 40-52
Author(s):  
D. Volkov
Keyword(s):  
Public Administration ◽  
Digital Technologies ◽  
Digital Economy ◽  
The State ◽  
Long Wave ◽  
End To End ◽  
Advanced Development ◽  
Digital Sphere

The article proves the need to "return" the state to the economy in order to implement digital mobilization and form a new mechanism of public administration, including the article analyzes the key conditions for Russia’s transition to the path of "advanced development", reveals not only the content of the levels of the digital sphere, but also its end-to-end digital technologies, all the challenges and threats generated by the development of the digital economy, examines the need and possibility of Russia’s movement to the sixth technological order, provides an algorithm for the transition to the phase of a new long wave (the big or Kondratiev cycle).

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