The concentration-depth profile at the surface of a solution of tetrabutylammonium iodide in formamide, based on angle-resolved photoelectron spectroscopy

F Eschen; M Heyerhoff; H Morgner; J Vogt

doi:10.1088/0953-8984/7/10/006

The concentration-depth profile at the surface of a solution of tetrabutylammonium iodide in formamide, based on angle-resolved photoelectron spectroscopy

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/7/10/006 ◽

1995 ◽

Vol 7 (10) ◽

pp. 1961-1978 ◽

Cited By ~ 31

Author(s):

F Eschen ◽

M Heyerhoff ◽

H Morgner ◽

J Vogt

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Concentration Depth Profile ◽

Tetrabutylammonium Iodide

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An X-ray photoelectron spectroscopy depth profile study on the InGeNi/(110) cleaved GaAs structure

Materials Science in Semiconductor Processing ◽

10.1016/j.mssp.2018.02.022 ◽

2018 ◽

Vol 82 ◽

pp. 62-66 ◽

Cited By ~ 1

Author(s):

Constantin Catalin Negrila ◽

Mihail Florin Lazarescu ◽

Constantin Logofatu ◽

Rodica V. Ghita ◽

Costel Cotirlan

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Gaas Structure ◽

Profile Study

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Non-destructive initial-profile-free depth profile evaluation of thin-film sample using angle-resolved X-ray photoelectron spectroscopy and profile smoothing regularization

Japanese Journal of Applied Physics ◽

10.35848/1347-4065/ac1fba ◽

2021 ◽

Vol 60 (10) ◽

pp. 101003

Author(s):

Yutaka Hoshina ◽

Kazuya Tokuda ◽

Yoshihiro Saito

Keyword(s):

Thin Film ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Thin Film Sample ◽

Film Sample ◽

Initial Profile ◽

X Ray ◽

Non Destructive

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In-Depth Profile of Hf-Based Gate Insulator Films on Si Substrates Studied by Angle-Resolved Photoelectron Spectroscopy Using Synchrotron Radiation

Journal of Surface Analysis ◽

10.1384/jsa.15.299 ◽

2009 ◽

Vol 15 (3) ◽

pp. 299-302 ◽

Cited By ~ 4

Author(s):

S. Toyoda ◽

H. Kumigashira ◽

M. Oshima ◽

G. L. Liu ◽

Z. Liu ◽

...

Keyword(s):

Synchrotron Radiation ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Gate Insulator ◽

Si Substrates

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Electrochemical Measurement of the Concentration Depth-profile of Cr near the Surface of Fe-Cr Alloys

Corrosion engineering digest ◽

10.3323/jcorr1974.32.3_163 ◽

1983 ◽

Vol 32 (3) ◽

pp. 163-165 ◽

Cited By ~ 2

Author(s):

Tetsutaro Ogushi

Keyword(s):

Depth Profile ◽

Electrochemical Measurement ◽

Concentration Depth Profile

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Angle-resolved Photoelectron Spectroscopy Study on Atomic-scale Depth Profile of Composition and Chemical Structure of Gate Dielectrics

ECS Meeting Abstracts ◽

10.1149/ma2005-01/9/396 ◽

2005 ◽

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Chemical Structure ◽

Gate Dielectrics ◽

Atomic Scale ◽

Spectroscopy Study

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Photoelectron spectroscopy as applied to study the depth profile of polypropylene film

Polimery ◽

10.14314/polimery.1999.246 ◽

1999 ◽

Vol 44 (04) ◽

pp. 246-254 ◽

Cited By ~ 2

Author(s):

MARIAN ZENKIEWICZ ◽

JAN GOLEBIEWSKI

Keyword(s):

Depth Profile ◽

Photoelectron Spectroscopy ◽

Polypropylene Film

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X-ray photoelectron spectroscopy depth profile of chemically modified porous silicon

Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena ◽

10.1116/1.2178373 ◽

2006 ◽

Vol 24 (2) ◽

pp. 852 ◽

Cited By ~ 2

Author(s):

A. Jasper Nijdam ◽

Mark Ming-Cheng Cheng ◽

Mauro Ferrari

Keyword(s):

Porous Silicon ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

X Ray ◽

Chemically Modified

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Comparison of angle‐resolved x‐ray photoelectron spectroscopy/Auger electron spectroscopy with depth profile restoration from inelastic background analysis

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.579210 ◽

1994 ◽

Vol 12 (4) ◽

pp. 2337-2341 ◽

Cited By ~ 1

Author(s):

Wolfgang S. M. Werner ◽

Igor S. Tilinin

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

X Ray

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Effect of bromide on the interfacial structure of aqueous tetrabutylammonium iodide: Photoelectron spectroscopy and molecular dynamics simulations

Chemical Physics Letters ◽

10.1016/j.cplett.2005.05.084 ◽

2005 ◽

Vol 410 (4-6) ◽

pp. 222-227 ◽

Cited By ~ 22

Author(s):

Bernd Winter ◽

Ramona Weber ◽

Ingolf V. Hertel ◽

Manfred Faubel ◽

Luboš Vrbka ◽

...

Keyword(s):

Molecular Dynamics ◽

Molecular Dynamics Simulations ◽

Photoelectron Spectroscopy ◽

Interfacial Structure ◽

Tetrabutylammonium Iodide ◽

Dynamics Simulations

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Inverse problem: the concentration depth profile of elements from ARXPS data

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/0368-2048(95)02352-6 ◽

1995 ◽

Vol 74 (1) ◽

pp. 67-75 ◽

Cited By ~ 4

Author(s):

G.Yu. Cherkashinin

Keyword(s):

Inverse Problem ◽

Depth Profile ◽

Concentration Depth Profile

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