Determination of the characteristic magnetic pre-sheath length at divertor surfaces using micro-engineered targets on DiMES at DIII-D

2021 ◽  
Author(s):  
Shota Abe ◽  
Charles Skinner ◽  
Igor Bykov ◽  
Yao-Wen Yeh ◽  
Ane Lasa ◽  
...  

Abstract The magnetic pre-sheath (MPS) width, L MPS, is a critical parameter to define the sheath potential, which controls the ion trajectory of low-Z species (D, T, He, and C), as well as the prompt re-deposition of high-Z species. To determine L MPS, we fabricated micro-trenches (30×30×4 µm) via focused ion beam (FIB) milling on a silicon surface and exposed them to L-mode deuterium plasmas in DIII-D via the Divertor Material Evaluation System (DiMES) removable sample exposure probe. The areal distribution of impurity depositions, mainly consisting of carbon, was measured by energy-dispersive X-ray spectroscopy (EDS) to reveal the deuterium ion shadowing effect on the trench floors. The carbon deposition profiles showed that the erosion was maximized for the azimuthal direction of φ = -40° (referenced to the toroidal magnetic field direction) as well as the polar angle of θ = 80°. A Monte Carlo equation-of-motion model, based on a collisionless MPS, was used to calculate the azimuthal and polar deuterium ion angle distributions (IADs) for a range of L MPS = k × ρ i, where ρ i is the ion gyro radius and k = 0.5-4. Then, gross erosion profiles were calculated by a Monte Carlo micro-patterning and roughness (MPR) code for ion sputtering using as input the calculated azimuthal and polar IADs for each value of k. Good agreement with the experimental C deposition profiles was obtained for the case k = 2.5-3.5. This result is consistent with a previous kinetic modeling prediction of k ~ 3, as well as previous analytical investigations that predicted the L MPS to be several ion gyro radii. A validation of theoretical sheath models supports its applicability to ITER and pilot plant divertors to successfully predict plasma-materials interactions.

2005 ◽  
Vol 252 (5) ◽  
pp. 2063-2070
Author(s):  
Hiroyuki Yoshikawa ◽  
Shuhei Namba ◽  
Yoshihiro Yokote ◽  
Yasuhiro Aoyama ◽  
Hiroshi Masuhara

2010 ◽  
Vol 87 (5-8) ◽  
pp. 1597-1599 ◽  
Author(s):  
D. Kunder ◽  
E. Baer ◽  
M. Sekowski ◽  
P. Pichler ◽  
M. Rommel

1998 ◽  
Vol 4 (S2) ◽  
pp. 858-859 ◽  
Author(s):  
B.I. Prenitzer ◽  
L.A. Giannuzzi ◽  
S.R. Brown ◽  
R.B. Irwin ◽  
T.L. Shofner ◽  
...  

The focused ion beam (FIB) lift-out method is a high precision technique by which site-specific cross-section transmission electron microscopy (TEM) specimens may be rapidly prepared from virtually any material. The technique is particularly useful when the sample geometry or composition is complex (e.g., fibers, powders, composites and interfaces). In addition to the preparation of TEM specimens, FIB milling has also found widespread utility in micromachining and microfabrication applications as well as specimen preparation for scanning electron microscopy (SEM) and secondary ion mass spectrometry (SIMS).As the applications of the FEB instrument continue to become more universally recognized, the need to understand the interrelationships between the target material, processing parameters, and process efficiency of the milling phenomena becomes more critical. Incident ion attack angle, target material stopping efficiency and sputtering yield, Y, are important variables governing the milling process. TRIM, a binary collision approximation Monte Carlo simulation code, is used to physically model variables that influence FIB sputtering behavior.


2019 ◽  
Vol 1 (9) ◽  
pp. 3584-3596 ◽  
Author(s):  
Kyle T. Mahady ◽  
Shida Tan ◽  
Yuval Greenzweig ◽  
Amir Raveh ◽  
Philip D. Rack

Successful development of a Monte Carlo simulation that accurately emulates gas assisted nanoscale focused ion beam etching.


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