Electron-beam deposition of thermoconducting ceramic coatings for microelectronic devices
2021 ◽
Vol 2064
(1)
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pp. 012072
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Abstract This paper presents the experimental study of dielectric coatings based on aluminum oxide (Al2O3) and aluminum nitride (AlN) ceramics as applied to their use in microelectronics. It is shown that the coatings obtained by electron-beam evaporation of ceramic in forevacuum pressures (1-100 Pa) endow devices with required dielectric parameters and improves heat sink from the surface of monolithic integral circuits.
2020 ◽
Vol 4
(2)
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pp. AMP1401453-AMP1401453
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2005 ◽
Vol 44
(3-4)
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pp. 137-142
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