scholarly journals Electron-beam deposition of thermoconducting ceramic coatings for microelectronic devices

2021 ◽  
Vol 2064 (1) ◽  
pp. 012072
Author(s):  
E M Oks’ ◽  
A V Tyunkov ◽  
Y G Yushkov ◽  
D B Zolotukhin

Abstract This paper presents the experimental study of dielectric coatings based on aluminum oxide (Al2O3) and aluminum nitride (AlN) ceramics as applied to their use in microelectronics. It is shown that the coatings obtained by electron-beam evaporation of ceramic in forevacuum pressures (1-100 Pa) endow devices with required dielectric parameters and improves heat sink from the surface of monolithic integral circuits.

2016 ◽  
Author(s):  
Andrey Tyunkov ◽  
Yury Yushkov ◽  
Denis Zolotukhin ◽  
Efim Oks

Coatings ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 645
Author(s):  
Yury G. Yushkov ◽  
Efim M. Oks ◽  
Andrey V. Tyunkov ◽  
Alexey Y. Yushenko ◽  
Denis B. Zolotukhin

This work presents the results of the coating deposition by electron-beam evaporation of aluminum nitride and aluminum oxide targets in nitrogen and oxygen atmospheres in the forevacuum range (5–30 Pa). The method we employed is a combination of the electron-beam and plasma methods, since in the mentioned pressure range, the electron beam creates plasma that essentially changes the interaction picture of both the electron beam with the ceramic target and the flux of evaporated material with a substrate. We show a possibility of depositing such coatings on monolithic microwave integrated circuits passivated by Si3N4 dielectric.


2020 ◽  
Vol 46 (13) ◽  
pp. 21190-21195
Author(s):  
Yu.G. Yushkov ◽  
E.M. Oks ◽  
A.V. Tyunkov ◽  
D.B. Zolotukhin ◽  
A. Yu. Yushenko ◽  
...  

Vacuum ◽  
2021 ◽  
Vol 184 ◽  
pp. 109944
Author(s):  
D.B. Zolotukhin ◽  
A.A. Klimov ◽  
E.M. Oks ◽  
A.V. Tyunkov ◽  
Yu.G. Yushkov ◽  
...  

1996 ◽  
Vol 290-291 ◽  
pp. 80-83 ◽  
Author(s):  
S.B. Qadri ◽  
E.F. Skelton ◽  
P. Lubitz ◽  
N.V. Nguyen ◽  
H.R. Khan

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