scholarly journals Probing electric properties of GaP nanowires with Kelvin probe force microscopy

2021 ◽  
Vol 2086 (1) ◽  
pp. 012207
Author(s):  
V A Sharov ◽  
P A Alekseev ◽  
V V Fedorov ◽  
I S Mukhin
Keyword(s):  
Fermi Level ◽  
Kelvin Probe Force Microscopy ◽  
Scanning Probe ◽  
Kelvin Probe ◽  
Free Standing ◽  
Force Microscopy ◽  
Fermi Level Pinning ◽  
Zinc Blende ◽  
Crystal Phases ◽  
The Difference

Abstract Surface electronic properties of GaP nanowires were investigated using scanning probe force microscopy. I-V curves of individual free-standing NWs with different doping types were obtained. Surface Fermi level positions in the nanowires of different crystal phases and doping types were extracted using phase-modulated Kelvin probe force microscopy. The results indicate on weak Fermi level pinning in GaP nanowires. The difference between wurtzite and zinc blende GaP work function is observed.

Scanning Kelvin Probe Force Microscopy Study of Hydrogen Distribution and Evolution in Duplex Stainless Steel

2017 ◽  
Author(s):  
Bai An ◽  
Zhengli Hua ◽  
Takashi Iijima ◽  
Chaohua Gu ◽  
Jinyang Zheng ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Duplex Stainless Steel ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Hydrogen Distribution ◽  
Force Microscopy ◽  
Hydrogen Charging ◽  
Scanning Kelvin Probe ◽  
The Difference ◽  
Two Phases

Detecting hydrogen distribution at micro- and nano-scale is important for understanding the mechanisms of hydrogen embrittlement in metals. In this study, scanning Kelvin probe force microscopy (SKPFM), which can detect the variation of surface contact potential difference (CPD) caused by hydrogen, is applied to investigate the hydrogen distribution and evolution in thermally hydrogen-charged (HC) super duplex stainless steel. The SKPFM observations reveal that the CPD distribution becomes nonuniform in both the ferrite and austenite phases after hydrogen charging, implying that hydrogen distributes heterogeneously in the two phases. The average CPDs of both the ferrite and austenite phases are significantly decreased and the difference of CPD between two phases reaches a maximum shortly after thermal hydrogen-charging. The average CPDs of both the ferrite and austenite phases recover and the difference of CPD between two phases is decreased upon release of the hydrogen. These results are discussed in terms of the hydrogen outgasing behavior and the difference of hydrogen diffusivity in the two phases.

scholarly journals Investigation on energy bandgap states of amorphous SiZnSnO thin films

2019 ◽  
Vol 9 (1) ◽  
Author(s):  
Byeong Hyeon Lee ◽  
Kyung-Sang Cho ◽  
Doo-Yong Lee ◽  
Ahrum Sohn ◽  
Ji Ye Lee ◽  
...  
Keyword(s):  
Fermi Level ◽  
Photoelectron Spectroscopy ◽  
Systematic Change ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Energy Bandgap ◽  
Resolution Electron ◽  
The Difference ◽  
Electron Energy Loss ◽  
Good Agreement

AbstractThe variation in energy bandgaps of amorphous oxide semiconducting SiZnSnO (a-SZTO) has been investigated by controlling the oxygen partial pressure (Op). The systematic change in Op during deposition has been used to control the electrical characteristics and energy bandgap of a-SZTO. As Op increased, the electrical properties degraded, while the energy bandgap increased systematically. This is mainly due to the change in the oxygen vacancy inside the a-SZTO thin film by controlling Op. Changes in oxygen vacancies have been observed by using X-ray photoelectron spectroscopy (XPS) and investigated by analyzing the variation in density of states (DOS) inside the energy bandgaps. In addition, energy bandgap parameters, such as valence band level, Fermi level, and energy bandgap, were extracted by using ultraviolet photoelectron spectroscopy, Kelvin probe force microscopy, and high-resolution electron energy loss spectroscopy. As a result, it was confirmed that the difference between the conduction band minimum and the Fermi level in the energy bandgap increased systematically as Op increases. This shows good agreement with the measured results of XPS and DOS analyses.

scholarly journals Dynamically visualizing battery reactions by operando Kelvin probe force microscopy

2019 ◽  
Vol 2 (1) ◽  
Author(s):  
Hideki Masuda ◽  
Kyosuke Matsushita ◽  
Daigo Ito ◽  
Daisuke Fujita ◽  
Nobuyuki Ishida
Keyword(s):  
Lithium Ion ◽  
Kelvin Probe Force Microscopy ◽  
Electrochemical Reactions ◽  
Dynamic Visualization ◽  
Kelvin Probe ◽  
Energy Storage Devices ◽  
Daily Lives ◽  
Storage Devices ◽  
Force Microscopy ◽  
The Difference

AbstractEnergy storage devices using electrochemical reactions have become an integral part of our daily lives, and further improvement of their performance is highly demanded. An important task for this purpose is to thoroughly understand the electrochemical processes governing their chemistry. Here we develop a method based on Kelvin probe force microscopy that enables dynamic visualization of changes in the internal potential distribution in an operating electrochemical device and use it to characterize an all-solid-state lithium ion battery. Observation of the cathode composite regions during a cyclic voltammetry operation reveals differences between the behavior of local electrochemical reactions in the charge and discharge processes. Based on careful inspection of the results, we show that the difference arises from a change in the state of an electronic conductive path network in the composite electrode. Our method provides new insights into the local electrochemical reactions during electrochemical operation of devices.

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