Determining the optical properties of a mixed-metal oxide film, Co3−x−yCrxFeyO4, with spectroscopic ellipsometry and atomic force microscopy

Mixed Metal Oxide ◽

Mixed Metal ◽

Force Microscopy ◽

Atomic Force ◽

In Situ Growth Route To Fabricate Ternary Co–Ni–Al Mixed-Metal Oxide Film as a Promising Structured Catalyst for the Oxidation of Benzyl Alcohol

Industrial & Engineering Chemistry Research ◽

10.1021/acs.iecr.6b04859 ◽

2017 ◽

Vol 56 (15) ◽

pp. 4237-4244 ◽

Cited By ~ 6

Author(s):

Chao Zhao ◽

Jia Wu ◽

Lan Yang ◽

Guoli Fan ◽

Feng Li

Keyword(s):

Oxide Film ◽

Metal Oxide ◽

Benzyl Alcohol ◽

Mixed Metal Oxide ◽

In Situ Growth ◽

Mixed Metal ◽

Structured Catalyst ◽

Oxidation Of Benzyl Alcohol ◽

Electrical and optical properties of Sn doped CuInO2 thin films: Conducting atomic force microscopy and spectroscopic ellipsometry studies

Journal of Applied Physics ◽

10.1063/1.3211941 ◽

2009 ◽

Vol 106 (5) ◽

pp. 053709 ◽

Cited By ~ 14

Author(s):

Mandeep Singh ◽

B. R. Mehta ◽

Deepak Varandani ◽

V. N. Singh

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Optical Properties ◽

Electrical And Optical Properties ◽

Force Microscopy ◽

Atomic Force

Surface topography and optical properties of Ge-Sb(As)-S-Te thin films by atomic-force microscopy and variable angle spectroscopic ellipsometry

Journal of Physics Conference Series ◽

10.1088/1742-6596/356/1/012019 ◽

2012 ◽

Vol 356 ◽

pp. 012019 ◽

Cited By ~ 2

Author(s):

N Dulgheru (Nedelcu) ◽

M Anastasescu ◽

M Nicolescu ◽

M Stoica ◽

M Gartner ◽

...

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Optical Properties ◽

Surface Topography ◽

Variable Angle Spectroscopic Ellipsometry

Force Microscopy ◽

Atomic Force ◽

Variable Angle ◽

Mg–Al mixed metal oxide film derived from layered double hydroxide precursor film: Fabrication and antibacterial properties

Journal of the Taiwan Institute of Chemical Engineers ◽

10.1016/j.jtice.2015.05.017 ◽

2015 ◽

Vol 57 ◽

pp. 160-166 ◽

Cited By ~ 5

Author(s):

Yi Wang ◽

Dun Zhang ◽

Dandan Lv ◽

Yan Sun

Keyword(s):

Oxide Film ◽

Metal Oxide ◽

Layered Double Hydroxide ◽

Antibacterial Properties ◽

Precursor Film ◽

Mixed Metal Oxide ◽

Mixed Metal ◽

Film Fabrication ◽

Double Hydroxide ◽

Capacitive deionization from reconstruction of NiCoAl-mixed metal oxide film electrode based on the “memory effect”

Applied Surface Science ◽

10.1016/j.apsusc.2018.08.055 ◽

2018 ◽

Vol 459 ◽

pp. 767-773 ◽

Cited By ~ 6

Author(s):

Chengzhi Hu ◽

Ting Wang ◽

Jingjing Dong ◽

Ruiping Liu ◽

Huijuan Liu ◽

...

Keyword(s):

Oxide Film ◽

Metal Oxide ◽

Memory Effect ◽

Mixed Metal Oxide ◽

Film Electrode ◽

Capacitive Deionization ◽

Mixed Metal ◽

Optical Investigation of Zn(Al)O Mixed Metal Oxide Film for TCO-Based Applications

SSRN Electronic Journal ◽

10.2139/ssrn.3932118 ◽

2021 ◽

Author(s):

Ethar Yahya Salih ◽

Asmiet Ramizy ◽

Mohd Faizul Mohd Sabri ◽

Osamah Aldaghri ◽

Nawal Madkhali ◽

...

Keyword(s):

Oxide Film ◽

Metal Oxide ◽

Mixed Metal Oxide ◽

Optical Investigation ◽

Mixed Metal ◽

Preparation and Application of the Mixed Metal Oxide Film Based on Electron-Beam Physical Vapor Deposition for the Electrochemical Potential Sensors

Advanced Science Letters ◽

10.1166/asl.2013.4546 ◽

2013 ◽

Vol 19 (6) ◽

pp. 1613-1617

Author(s):

Yi Hong ◽

Guofu Qiao ◽

Guangping Song ◽

Tong Zhang

Keyword(s):

Electron Beam ◽

Oxide Film ◽

Metal Oxide ◽

Vapor Deposition ◽

Physical Vapor Deposition ◽

Electrochemical Potential ◽

Mixed Metal Oxide ◽

Mixed Metal ◽

Atomic force microscopy of thin Ag films. Relationship between morphology and optical properties

Chemical Physics Letters ◽

10.1016/0009-2614(93)87106-d ◽

1993 ◽

Vol 212 (1-2) ◽

pp. 50-56 ◽

Cited By ~ 15

Author(s):

Shane E. Roark ◽

Kathy L. Rowlen

Keyword(s):

Atomic Force Microscopy ◽

Optical Properties ◽

Force Microscopy ◽

Atomic Force

Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ◽

Atomic force microscopy correlated with spectroscopic ellipsometry during homepitaxial growth on GaAs(111)B substrates

10.1116/1.589970 ◽

1998 ◽

Vol 16 (3) ◽

pp. 1479 ◽

Cited By ~ 2

Author(s):

D. H. Tomich

Keyword(s):

Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

Observation of Ag photodoping phenomena in GeS2 chalcogenide glass films by spectroscopic ellipsometry and atomic force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2013.06.013 ◽

2013 ◽

Vol 542 ◽

pp. 246-250 ◽

Cited By ~ 5

Author(s):

Yoshihisa Murakami ◽

Moriaki Wakaki

Keyword(s):

Atomic Force Microscopy ◽

Chalcogenide Glass ◽

Force Microscopy ◽

Atomic Force ◽

Glass Films