Accurate Quantification of the Optical Absorption Coefficient and of the Thermal Relaxation Time for PMMA and for Low-Water-Content Media During Early Ablation with CO2Laser Beam at the Wavelength of 10.6 μm

2011 ◽  
Vol 29 (1) ◽  
pp. 61-66 ◽  
Author(s):  
Franco Canestri
Keyword(s):  
Relaxation Time ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Water Content ◽  
Thermal Relaxation ◽  
Thermal Relaxation Time ◽  
Optical Absorption Coefficient ◽  
Accurate Quantification

scholarly journals Optical Absorption Coefficient of a Dispersion of Clusters Composed of a Large Number of Spheres

1987 ◽  
Vol 6 (2) ◽  
pp. 173-181 ◽  
Author(s):  
F. Borghese ◽  
P. Denti ◽  
R. Saija ◽  
G. Toscano ◽  
O. I. Sindoni
Keyword(s):  
Optical Absorption ◽  
Absorption Coefficient ◽  
Optical Absorption Coefficient

Quantitative photopyroelectric out-of-phase spectroscopy of amorphous silicon thin films deposited on crystalline silicon

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Dynamic Range ◽  
Crystalline Silicon ◽  
Optical Absorption Coefficient ◽  
Si Substrates ◽  
Silicon Thin Films ◽  
Background Compensation

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.

Reversible Changes in the Electronic and Optical Properties of Micro-Crystalline ln2O 3-x: A Comparison with Amorphous In2O3-x

1996 ◽  
Vol 426 ◽  
Author(s):  
B. Pashmakov ◽  
H. Fritzsche ◽  
B. Claflin
Keyword(s):  
Optical Properties ◽  
Optical Absorption ◽  
Absorption Coefficient ◽  
Ultraviolet Light ◽  
Indium Oxide ◽  
Electrical Conductance ◽  
Inert Gas ◽  
Optical Absorption Coefficient ◽  
Electronic And Optical Properties

AbstractThe electrical conductance and optical absorption coefficient of microcrystalline indium oxide (c – In2 O 3-x ) can be changed reversibly by several orders of magnitude by photoreduction and reoxidation. Photoreduction is achieved by exposure to ultraviolet light hv ≥ 3.5eV in vacuum or an inert gas. The effects are similar to those previously observed in amorphous In2 O3-x

On measurement of the thermal relaxation time in transient thermal processes of solids

2015 ◽  
Vol 58 (3) ◽  
pp. 251-257 ◽  
Author(s):  
Yu. A. Kirsanov ◽  
A. Yu. Kirsanov ◽  
K. Kh. Gil’fanov ◽  
A. E. Yudakhin
Keyword(s):  
Relaxation Time ◽  
Thermal Relaxation ◽  
Thermal Relaxation Time ◽  
Thermal Processes ◽  
Transient Thermal
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