Introduction to Scanning Tunneling Microscopy

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it enables non-destructive observing and mapping atoms and molecules on solid surfaces down to a picometer resolution. A recent development is the non-destructive observation of wavefunctions in individual atoms and molecules, including nodal structures inside the wavefunctions. STM and AFM have become indespensible instruments for scientists of various disciplines, including physicists, chemists, engineers, and biologists to visualize and utilize the microscopic world around us. Since the publication of the first edition in 1993, this book has been recognized as a standard introduction for everyone that starts working with scanning probe microscopes, and a useful reference book for those more advanced in the field. After an Overview chapter accessible for newcomers at an entry level presenting the basic design, scientific background, and illustrative applications, the book has three Parts. Part I, Principles, provides the most systematic and detailed theory of its scientific bases from basic quantum mechancis and condensed-metter physics in all available literature. Quantitative analysis of its imaging mechanism for atoms, molecules, and wavefunctions is detailed. Part II, Instrumentation, provides down to earth descriptions of its building components, including piezoelectric scanners, vibration isolation, electronics, software, probe tip preparation, etc. Part III, Related methods, presenting two of its most important siblings, scanning tunnelling specgroscopy and atomic force miscsoscopy. The book has five appendices for background topics, and 405 references for further readings.