Selection of neutron-absorbing materials to improve the low-energy response of a Zr-based extended neutron monitor using Monte Carlo simulations

2014 ◽  
Vol 163 (2) ◽  
pp. 160-165 ◽  
Author(s):  
K. Biju ◽  
C. Sunil ◽  
S. P. Tripathy ◽  
D. S. Joshi ◽  
T. Bandyopadhyay ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Neutron Monitor ◽  
Low Energy ◽  
Energy Response ◽  
Absorbing Materials ◽  
Selection Of

Interface dosimetry: measurements and Monte Carlo simulations of low-energy photon beams

2001 ◽  
Vol 61 (3-6) ◽  
pp. 593-595 ◽  
Author(s):  
Indra J. Das ◽  
Alireza Kassaee ◽  
Frank Verhaegen ◽  
Vadim P. Moskvin
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Photon Beams ◽  
Energy Photon

Quantitative Analysis of the Evolution of Surface Growth Morphology in LEEM

1998 ◽  
Vol 05 (06) ◽  
pp. 1151-1158 ◽  
Author(s):  
J. B. Hannon ◽  
G. L. Kellogg ◽  
M. C. Bartelt ◽  
N. C. Bartelt
Keyword(s):  
Electron Microscopy ◽  
Monte Carlo ◽  
Quantitative Analysis ◽  
Diffusion Equation ◽  
Monte Carlo Simulations ◽  
Low Energy ◽  
Growth Morphology ◽  
Equation Analysis ◽  
Low Energy Electron ◽  
And Diffusion

We describe Monte Carlo simulations and diffusion equation analysis which are useful in deriving kinetic parameters from low energy electron microscopy experiments. An analysis of the etching of the Si(001) surface with molecular oxygen is made, illustrating the power of these techniques.

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