Chemical diffusion of oxygen in single-crystal and polycrystallineYBa2Cu3O6+xdetermined by electrical-resistance measurements

1993 ◽  
Vol 47 (6) ◽  
pp. 3380-3390 ◽  
Author(s):  
John R. LaGraff ◽  
David A. Payne
Keyword(s):  
Single Crystal ◽  
Electrical Resistance ◽  
Chemical Diffusion ◽  
Electrical Resistance Measurements

Electrical resistance measurements on young balsam fir trees in relation to specific volume increment, foliar biomass, and ion content of bark and wood

1984 ◽  
Vol 14 (2) ◽  
pp. 177-180 ◽  
Author(s):  
H. Plene ◽  
R. G. Thompson ◽  
J. E. McIsaac ◽  
D. S. Fensom
Keyword(s):  
Electrical Resistance ◽  
Specific Volume ◽  
Balsam Fir ◽  
Ion Content ◽  
Volume Increment ◽  
Electrical Resistance Measurements ◽  
Foliar Biomass

Electrical resistance in young balsam fir (Abiesbalsamea (L.) Mill.) trees was inversely (nonlinear) correlated with specific volume increment, total foliar biomass, and the combined weight of the current and 1-year-old foliage. These relationships were stronger before budbreak than after. No relationship existed between concentrations of N, P, K, Ca, and Mg in the bark and wood collected around time of budbreak, and electrical resistance.

Characterization of Phase Transitions Occurring in Solution Treated Ti-15Mo during Heating by Thermal Expansion and Electrical Resistance Measurements

2016 ◽  
Vol 879 ◽  
pp. 2318-2323 ◽  
Author(s):  
Pavel Zháňal ◽  
Petr Harcuba ◽  
Michal Hájek ◽  
Jana Šmilauerová ◽  
Jozef Veselý ◽  
...  
Keyword(s):  
Thermal Expansion ◽  
Titanium Alloy ◽  
Phase Transitions ◽  
Electrical Resistance ◽  
Temperature Changes ◽  
Solution Treated ◽  
Electrical Resistance Measurements ◽  
Ongoing Phase

Metastable β titanium alloy Ti-15Mo was investigated in this study. In-situ electrical resistance and thermal expansion measurements conducted on solution treated material revealed influence of ongoing phase transitions on measured properties. The monotonicity of the dependence of electrical resistance on temperature changes at 225, 365 and 560 °C The thermal expansion deviates from linearity between 305 and 580 °C.

Thermal Conductivity of Single-Crystal Silicon Microbridges Measured by Electrical Resistance Thermometry and Time-Domain Thermoreflectance

2012 ◽  
Author(s):  
Timothy S. English ◽  
Leslie M. Phinney ◽  
Patrick E. Hopkins ◽  
Justin R. Serrano
Keyword(s):  
Thermal Conductivity ◽  
Single Crystal ◽  
Time Domain ◽  
Electrical Resistance ◽  
Microelectromechanical Systems ◽  
Single Crystal Silicon ◽  
Operating Conditions ◽  
Equation Modeling ◽  
Crystal Silicon ◽  
Resistance Thermometry

Accurate thermal conductivity values are essential to the modeling, design, and thermal management of microelectromechanical systems (MEMS) and devices. However, the experimental technique best suited to measure thermal conductivity, as well as thermal conductivity itself, varies with the device materials, fabrication conditions, geometry, and operating conditions. In this study, the thermal conductivity of boron doped single-crystal silicon-on-insulator (SOI) microbridges is measured over the temperature range from 77 to 350 K. The microbridges are 4.6 mm long, 125 μm tall, and two widths, 50 or 85 μm. Measurements on the 85 μm wide microbridges are made using both steady-state electrical resistance thermometry and optical time-domain thermoreflectance. A thermal conductivity of ∼ 77 W/mK is measured for both microbridge widths at room temperature, where both experimental techniques agree. However, a discrepancy at lower temperatures is attributed to differences in the interaction volumes and in turn, material properties, probed by each technique. This finding is qualitatively explained through Boltzmann transport equation modeling under the relaxation time approximation.

scholarly journals The application of electrical resistance measurements to water transport in lime–masonry systems

2011 ◽  
Vol 106 (3) ◽  
pp. 669-677 ◽  
Author(s):  
R. J. Ball ◽  
G. C. Allen ◽  
M. A. Carter ◽  
M. A. Wilson ◽  
C. Ince ◽  
...  
Keyword(s):  
Water Transport ◽  
Electrical Resistance ◽  
Electrical Resistance Measurements

Kinetics of structural relaxation of bulk and ribbon Pd40Cu30Ni10P20 glasses determined from electrical resistance measurements

2007 ◽  
Vol 49 (8) ◽  
pp. 1411-1416 ◽  
Author(s):  
S. V. Khonik ◽  
V. V. Sviridov ◽  
N. P. Kobelev ◽  
M. Yu. Yazvitskiĭ ◽  
V. A. Khonik
Keyword(s):  
Structural Relaxation ◽  
Electrical Resistance ◽  
Electrical Resistance Measurements ◽  
Kinetics Of
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