scholarly journals Detection of a single-charge defect in a metal-oxide-semiconductor structure using vertically coupled Al and Si single-electron transistors

2009 ◽  
Vol 80 (15) ◽  
Author(s):  
L. Sun ◽  
B. E. Kane
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Semiconductor Structure ◽  
Single Electron ◽  
Oxide Semiconductor ◽  
Single Charge ◽  
Single Electron Transistors ◽  
Electron Transistors ◽  
Charge Defect ◽  
Metal Oxide Semiconductor Structure

scholarly journals Few electron limit of n-type metal oxide semiconductor single electron transistors

2012 ◽  
Vol 23 (21) ◽  
pp. 215204 ◽  
Author(s):  
Enrico Prati ◽  
Marco De Michielis ◽  
Matteo Belli ◽  
Simone Cocco ◽  
Marco Fanciulli ◽  
...  
Keyword(s):  
Metal Oxide ◽  
Metal Oxide Semiconductor ◽  
Single Electron ◽  
Oxide Semiconductor ◽  
Single Electron Transistors ◽  
Electron Transistors
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