scholarly journals Exploring the intrinsic limit of the charge-carrier-induced increase of the Curie temperature of Lu- and La-doped EuO thin films

2020 ◽  
Vol 4 (10) ◽  
Author(s):  
R. Held ◽  
T. Mairoser ◽  
A. Melville ◽  
J. A. Mundy ◽  
M. E. Holtz ◽  
...  
2000 ◽  
Vol 14 (29n31) ◽  
pp. 3735-3740 ◽  
Author(s):  
P. WAGNER ◽  
I. GORDON ◽  
A. DAS ◽  
J. VANACKEN ◽  
V. V. MOSHCHALKOV ◽  
...  

We performed a comparative study on the colossal negative magnetoresistivity and the Hall effect in thin films of the manganese perovskite La 1-x Ca x MnO 3 with x =0.3 and x =0.67. The underdoped sample ( x =0.3) undergoes a phase transition from a paramagnetic semiconductor to a ferromagnetic quasimetal at the Curie temperature T C =280 K , while the overdoped compound ( x =0.67) stays a paramagnetic semiconductor at all temperatures. Both materials show colossal negative magneto-resistivity, albeit on considerably different temperature- and field scales, depending on the magnetic interactions between neighbouring Mn ions. According to the Hall data, the charge carriers in the underdoped material are hole-type, partially compensated by an electron-type contribution. The overdoped system shows electronic carriers with a thermally activated concentration. The ordinary Hall effect is in both compounds superimposed by an anomalous Hall contribution with a sign opposite to the intrinsic charge-carrier type.


2009 ◽  
Vol 94 (22) ◽  
pp. 222110 ◽  
Author(s):  
S. S. N. Bharadwaja ◽  
C. Venkatasubramanian ◽  
N. Fieldhouse ◽  
S. Ashok ◽  
M. W. Horn ◽  
...  

2021 ◽  
Vol 207 ◽  
pp. 116683
Author(s):  
Jun Young Lee ◽  
Gopinathan Anoop ◽  
Sanjith Unithrattil ◽  
WooJun Seol ◽  
Youngki Yeo ◽  
...  

2015 ◽  
Vol 76 (1) ◽  
pp. 220-226 ◽  
Author(s):  
Dongfang Chen ◽  
Shengli Huang ◽  
Jianguo Chen ◽  
Jinrong Cheng

2002 ◽  
Vol 422 (1-2) ◽  
pp. 73-79 ◽  
Author(s):  
Kenichi Tsukada ◽  
Tsutomu Nagahama ◽  
Mitsugu Sohma ◽  
Iwao Yamaguchi ◽  
Takaaki Manabe ◽  
...  

2007 ◽  
Vol 124-126 ◽  
pp. 177-180
Author(s):  
Jang Sik Lee ◽  
Q.X. Jia

To investigate the anisotropic dielectric properties of layer-structured bismuth-based ferroelectrics along different crystal directions, we fabricate devices along different crystal orientations using highly c-axis oriented Bi3.25La0.75Ti3O12 (BLT) thin films on (001) LaAlO3 (LAO) substrates. Experimental results have shown that the dielectric properties of the BLT films are highly anisotropic along different crystal directions. The dielectric constants (1MHz at 300 K) are 358 and 160 along [100] and [110], respectively. Dielectric nonlinearity is also detected along these crystal directions. On the other hand, a much smaller dielectric constant and no detectable dielectric nonlinearity in a field range of 0-200 kV/cm are observed for films along [001] when c-axis oriented SRO is used as the bottom electrode.


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