Ab initiotest of the Warren–Averbach analysis on model palladium nanocrystals

2005 ◽  
Vol 38 (2) ◽  
pp. 266-273 ◽  
Author(s):  
Zbigniew Kaszkur ◽  
Bogusław Mierzwa ◽  
Jerzy Pielaszek

Model powder diffraction patterns were calculatedviathe Debye formula from atom positions of a range of energy-relaxed closed-shell cubooctahedral clusters. The energy relaxation employed the Sutton–Chen potential scheme with parameters for palladium. The assumed cluster size distribution followed lognormal distribution of a crystallite volume centred with the diameter of 5 nm, as well as two bimodal lognormal distributions centred around 4 nm and 7 nm. These models allowed an in-depth analysis of the Warren–Averbach method of separating strain and size effects in a peak shape Fourier analysis. The atom-displacement distribution in the relaxed clusters could be directly computed, as well as the strain Fourier coefficients. The results showed that in the case of the unimodal size distribution, the method can still be successfully used for obtaining the column length distribution. However, the strain Fourier coefficients obtained from three reflections (002, 004 and 008) cannot be reliably estimated with the Warren–Averbach method. The primary cause is a non-Gaussian strain distribution and a shift of the diffraction maximum, inherent to the nanoparticles, differing for every constituent cluster in the size distribution. For the bimodal size distributions, the obtained column length distributions tend to be shifted towards the centres of the modes and are less sensitive to the larger size mode.

2002 ◽  
Vol 35 (3) ◽  
pp. 338-346 ◽  
Author(s):  
N. C. Popa ◽  
D. Balzar

The size-broadened profile given by the lognormal and gamma size distributions of spherical crystallites is considered. An analytical approximation for the size-broadened profile is derived that can be analytically convolved with the strain-broadened and instrumental-broadened profiles. The method is tested on two CeO2powders; one shows `super-Lorentzian' profiles that were successfully modelled under the assumption of a broad lognormal size distribution. It is shown that the Voigt function, as a common model for a size-broadened profile, fails for both very narrow and broad size distributions. It is argued that the size-broadened line profile is not very sensitive to variations in size distribution and that an apparent domain size or even column-length distribution function can correspond to significantly different size distributions.


In this chapter, the X-ray peak profile broadening caused by the finite size of scattering crystallites is studied in detail. According to Bertaut’s theorem, the line profile with the indices hkl is determined by the length distribution of columns building up the scattering crystallites normal to the hkl reflecting planes. The column length distribution determined from line profiles can be converted into crystallite size distribution. The effect of median and variance of crystallite size distribution on the shape of line profiles is also discussed. The line shapes for different crystallite size distribution functions (e.g. lognormal and York distributions) are given. It is shown that for spherical crystallites the peak broadening does not depend on the indices of reflections. The dependence of line profiles on the indices hkl is presented for various anisotropic shapes of crystallites.


2000 ◽  
Vol 661 ◽  
Author(s):  
T. Ungár ◽  
J. Gubicza ◽  
G. Ribárik ◽  
T. W. Zerda

ABSTRACTThe crystallite size and size-distribution in carbon blacks in the presence of strain are determined by recently developed procedure of X-ray diffraction peak profile analysis. The Fourier coefficients of the measured physical profiles are fitted by Fourier coefficients of well established ab initio functions of size and strain peak profiles. Strain anisotropy is accounted for by expressing the mean square strain in terms of average dislocation contrast factors. Crystallite shape anisotropy is modelled by ellipsoids incorporated into the size profile function. To make the fitting procedure faster, the Fourier transform of the size profile is given as an analitical function. The method is applied to carbon blacks treated at different preassures and temperatures. The microstructure is characterised in terms of crystallite size distribution, dislocation density, and crystallite shape anisotropy.


1988 ◽  
Vol 41 (2) ◽  
pp. 101 ◽  
Author(s):  
William Parrish

The advantages of synchrotron radiation for X-ray polycrystalline diffraction are illustrated by a number of examples. The plane wave parallel-beam X-ray optics uses a Si(lll) channel monochromator for easy wavelength selection and a set of long parallel slits to define the diffracted beam. The constant simple instrument function and the high resolution symmetrical profiles (FWHM 0.05") greatly simplify the data analysis and add a new dimension to profile broadening studies. The geometry permits uncoupling the 6-26 sample-detector relationship without changing the profile shape and makes possible new applications such as grazing angle incidence depth analysis of thin films. The same instrumentation is used for high resolution energy dispersive diffraction (BOD) by step-scanning the monochromator. The resolution is two orders of magnitude better than conventional BOD and can be used at high count rates. The easy wavelength selection yields diffraction patterns with the highest PI B and permits anomalous scattering studies.


2014 ◽  
Vol 5 (10) ◽  
pp. 2509-2515 ◽  
Author(s):  
Kai Lin Ek ◽  
Shujun Wang ◽  
Jennie Brand-Miller ◽  
Les Copeland

Starch from a low glycemic index (GI) potato cultivar (Carisma, shown in the ESEM image) was more resistant to hydrothermal treatment than other potato starches, but was not differentiated from the other starches by granule size distribution, amylose and P contents, and amylopectin chain length distribution.


2001 ◽  
Vol 34 (3) ◽  
pp. 298-310 ◽  
Author(s):  
T. Ungár ◽  
J. Gubicza ◽  
G. Ribárik ◽  
A. Borbély

Two different methods of diffraction profile analysis are presented. In the first, the breadths and the first few Fourier coefficients of diffraction profiles are analysed by modified Williamson–Hall and Warren–Averbach procedures. A simple and pragmatic method is suggested to determine the crystallite size distribution in the presence of strain. In the second, the Fourier coefficients of the measured physical profiles are fitted by Fourier coefficients of well establishedab initiofunctions of size and strain profiles. In both procedures, strain anisotropy is rationalized by the dislocation model of the mean square strain. The procedures are applied and tested on a nanocrystalline powder of silicon nitride and a severely plastically deformed bulk copper specimen. The X-ray crystallite size distributions are compared with size distributions obtained from transmission electron microscopy (TEM) micrographs. There is good agreement between X-ray and TEM data for nanocrystalline loose powders. In bulk materials, a deeper insight into the microstructure is needed to correlate the X-ray and TEM results.


2014 ◽  
Vol 30 (1) ◽  
pp. 2-13 ◽  
Author(s):  
W. Wong-Ng ◽  
J.A. Kaduk ◽  
D.L. Siderius ◽  
A.L. Allen ◽  
L. Espinal ◽  
...  

Cu-paddle-wheel-based Cu3(BTC)2 (nicknamed Cu-BTC, where BTC ≡ benzene 1,3,5-tricarboxylate) is a metal organic framework (MOF) compound that adopts a zeolite-like topology. We have determined the pore-size distribution using the Gelb and Gubbins technique, the microstructure using small-angle neutron scattering and (ultra) small-angle X-ray scattering (USAXS\SAXS) techniques, and X-ray powder diffraction reference patterns for both dehydrated d-Cu-BTC [Cu3(C9H3O6)2] and hydrated h-Cu-BTC [Cu3(C9H3O6)2(H2O)6.96] using the Rietveld refinement technique. Both samples were confirmed to be cubic Fm$\bar 3$m (no. 225), with lattice parameters of a = 26.279 19(3) Å, V = 18 148.31(6) Å3 for d-Cu-BTC, and a = 26.3103(11) Å, and V = 18 213(2) Å3 for h-Cu-BTC. The structure of d-Cu-BTC contains three main pores of which the diameters are approximately, in decreasing order, 12.6, 10.6, and 5.0 Å. The free volume for d-Cu-BTC is approximately (71.85 ± 0.05)% of the total volume and is reduced to approximately (61.33 ± 0.03)% for the h-Cu-BTC structure. The d-Cu-BTC phase undergoes microstructural changes when exposed to moisture in air. The reference X-ray powder patterns for these two materials have been determined for inclusion in the Powder Diffraction File.


2011 ◽  
Vol 57 (206) ◽  
pp. 1046-1056 ◽  
Author(s):  
R.W. Obbard ◽  
K.E. Sieg ◽  
I. Baker ◽  
D. Meese ◽  
G.A. Catania

AbstractAn in-depth analysis of seven samples from the Siple Dome (Antarctica) ice core, using optical microscopy and electron backscatter diffraction, illustrates rotational recrystallization or polygonization in the fine-grained region of the core between 700 and 800 m. Between 640 and 700 m, the microstructure is characterized by a bimodal grain-size distribution and a broken girdle fabric with evidence of polygonization. From 727 to 770 m, mean grain size decreases and a single-maximum fabric is found, and, by 790 m, mean grain size has again increased and a multiple-maxima fabric manifests itself. We compare grain-size distribution, c- and a-axis orientation, and misorientation between adjacent grains. We found that misorientations between adjacent grains in the 727–770 m region were predominantly low-angle and typically around a common a-axis, suggesting polygonization. This conclusion is supported by radar evidence of a physical disturbance at 757 m, which may be correlated with higher than usual strain in the 700–800 m range. Below 770 m, larger less regular misorientations and textural evidence show that migration recrystallization is the primary recrystallization mechanism.


Sign in / Sign up

Export Citation Format

Share Document