scholarly journals Quantitative analysis of lamellar structures in brush polymer thin films by synchrotron grazing-incidence X-ray scattering

2007 ◽  
Vol 40 (3) ◽  
pp. 476-488 ◽  
Author(s):  
Jinhwan Yoon ◽  
Kyeong Sik Jin ◽  
Hyun Chul Kim ◽  
Gahee Kim ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Volume Fraction ◽  
Grazing Incidence ◽  
Distortion Factor ◽  
X Ray ◽  
Lamellar Structures ◽  
X Ray Scattering ◽  
Brush Polymer ◽  
Ray Scattering

In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for lamellar structures formed in thin films supported on substrates, and a comprehensive numerical analysis was performed using the scattering formula. A quantitative analysis was conducted of lamellar structures formed in nanometre-scaled thin films of a brush polymer, poly[oxy(n-decylthiomethylenyl)ethylene], supported on silicon substrates, by GIXS measurements during cooling and subsequent heating, and data analysis was performed using the scattering formula. This analysis provided details (long period, sub-layers and their thicknesses, volume fraction, bristle paracrystal distortion factor, and orientation) of the lamellar structure with varying temperature that are not easily obtained using conventional techniques. Moreover, a molecular structure model and electron density profiles were established.

scholarly journals Polystyrene-b-polyisoprene thin films with hexagonally perforated layer structure: quantitative grazing-incidence X-ray scattering analysis

2008 ◽  
Vol 41 (2) ◽  
pp. 281-291 ◽  
Author(s):  
Kyuyoung Heo ◽  
Jinhwan Yoon ◽  
Sangwoo Jin ◽  
Jehan Kim ◽  
Kwang-Woo Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Quantitative Analysis ◽  
Diblock Copolymer ◽  
Layer Structure ◽  
Grazing Incidence ◽  
Silicon Substrates ◽  
X Ray ◽  
Copolymer Films ◽  
X Ray Scattering ◽  
Ray Scattering

Grazing-incidence X-ray scattering (GIXS) formulas for hexagonally perforated layer (HPL) structures withABCandABstacking sequences were derived, and used in the quantitative analysis of the two-dimensional GIXS patterns of polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer thin films supported on silicon substrates. This quantitative analysis provided detailed information (shape, size and size distribution, packing order, layer packing sequence, and orientation) about the HPL structure of the diblock copolymer films that cannot be easily obtained with conventional X-ray and neutron scattering techniques or with conventional microscopic methods.

scholarly journals Detailed analysis of gyroid structures in diblock copolymer thin films with synchrotron grazing-incidence X-ray scattering

2007 ◽  
Vol 40 (5) ◽  
pp. 950-958 ◽  
Author(s):  
Sangwoo Jin ◽  
Jinhwan Yoon ◽  
Kyuyoung Heo ◽  
Hae-Woong Park ◽  
Jehan Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymer ◽  
Grazing Incidence ◽  
Orientation Distribution ◽  
Lattice Parameter ◽  
Two Dimensional ◽  
Distortion Factor ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

In this study, a grazing-incidence X-ray scattering (GIXS) formula was derived for gyroid structures formed in thin films supported on substrates. Two-dimensional GIXS patterns were measured for gyroid structures formed in polystyrene-b-polyisoprene (PS-b-PI) diblock copolymer nanometre-scale thin films supported on silicon substrates, and a quantitative analysis of the obtained two-dimensional GIXS data was conducted with the scattering formula. This analysis provided details (lattice parameter, width of the PS phase, positional distortion factor, orientation and orientation distribution) of the gyroid structures developed in the diblock copolymer thin films that are not easily obtained using conventional techniques. Moreover, it was possible to simulate complete and detailed two-dimensional GIXS patterns with the determined structure parameters.

Evaluation on Pore Structures of Organosilicate Thin Films by Grazing Incidence Small-Angle X-ray Scattering

2009 ◽  
Vol 113 (38) ◽  
pp. 12623-12627 ◽  
Author(s):  
Hong-Ji Chen ◽  
Sheng-Ying Li ◽  
Xiao-Jun Liu ◽  
Rui-Peng Li ◽  
Detlef-M. Smilgies ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Pore Structures ◽  
Organosilicate Thin Films ◽  
Ray Scattering

Grazing-incidence X-ray scattering of lamellar thin films

2019 ◽  
Vol 52 (2) ◽  
pp. 247-251
Author(s):  
Detlef-M. Smilgies
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Small Molecules ◽  
Film Studies ◽  
Grazing Incidence ◽  
Semicrystalline Polymers ◽  
X Ray ◽  
X Ray Scattering ◽  
Incident Plane ◽  
Ray Scattering

Recently, surface and thin-film studies using area detectors have become prevalent. An important class of such systems are lamellar thin films formed by small molecules, liquid crystals or semicrystalline polymers. Frequently, the lamellae align more or less parallel to the substrate. Such structures can be easily discerned by their characteristic X-ray scattering close to the incident plane. This paper describes how such patterns can be simulated, in order to extract morphological information about the thin film.

In-Situ Grazing Incidence Small-Angle X-ray Scattering Studies on Nanopore Evolution in Low-kOrganosilicate Dielectric Thin Films

2005 ◽  
Vol 38 (8) ◽  
pp. 3395-3405 ◽  
Author(s):  
Byeongdu Lee ◽  
Jinhwan Yoon ◽  
Weontae Oh ◽  
Yongtaek Hwang ◽  
Kyuyoung Heo ◽  
...  
Keyword(s):  
Thin Films ◽  
Small Angle ◽  
Grazing Incidence ◽  
Dielectric Thin Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Synchrotron Grazing Incidence X-ray Scattering Study of the Morphological Structures in Thin Films of a Polymethacrylate Diblock Copolymer Bearing POSS Moieties

2010 ◽  
Vol 114 (24) ◽  
pp. 8033-8042 ◽  
Author(s):  
Sangwoo Jin ◽  
Tomoyasu Hirai ◽  
Byungcheol Ahn ◽  
Yecheol Rho ◽  
Kwang-Woo Kim ◽  
...  
Keyword(s):  
Thin Films ◽  
Diblock Copolymer ◽  
Grazing Incidence ◽  
X Ray ◽  
X Ray Scattering ◽  
Scattering Study ◽  
Ray Scattering

Determination of Strain Distributions in Aluminum Thin Films as a Function of Temperature by the use of Synchrotron Grazing Incidence X-Ray Scattering

1991 ◽  
Vol 239 ◽  
Author(s):  
Ramnath Venkatraman ◽  
Paul R. Besser ◽  
Sean Brennan ◽  
John C. Bravman
Keyword(s):  
Thin Films ◽  
Room Temperature ◽  
Grazing Incidence ◽  
Surface Relaxation ◽  
Line Broadening ◽  
X Ray ◽  
Relaxation Effects ◽  
X Ray Scattering ◽  
Ray Scattering

ABSTRACTWe have measured elastic strain distributions with depth as a function of temperature in Al thin films of various thicknesses on oxidized silicon using synchrotron grazing incidence X-ray scattering (GIXS). Disregarding minor surface relaxation effects that depend on the film thickness, it is shown that there are no gross strain gradients in these films in the range of temperatures (between room temperature and 400°C) considered. We also observe X-ray line broadening effects, suggesting an accumulation of dislocations on cooling the films, and their annealing out as the films are reheated.

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