scholarly journals Grazing-incidence in-plane X-ray diffraction on ultra-thin organic films using standard laboratory equipment

2012 ◽  
Vol 45 (2) ◽  
pp. 367-370 ◽  
Author(s):  
Markus Neuschitzer ◽  
Armin Moser ◽  
Alfred Neuhold ◽  
Johanna Kraxner ◽  
Barbara Stadlober ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Organic Films ◽  
X Ray Diffraction ◽  
Laboratory Equipment ◽  
X Ray ◽  
Lattice Constants ◽  
Thin Organic Films ◽  
Position Sensitive

A novel grazing-incidence in-plane X-ray diffraction setup based on a commercial four-circle diffractometer with a sealed-ceramic copper X-ray tube, upgraded with parabolic graded multilayer X-ray optics and a one-dimensional position-sensitive detector, is presented. The high potential of this setup is demonstrated by a phase analysis study of pentacene thin films and the determination of in-plane lattice constants of pentacene mono- and multilayers. The quality of the results compare well to studies performed at synchrotron radiation facilities.

Structure determination of ultrathin NbSe2 films by Grazing incidence x-ray diffraction

1994 ◽  
Vol 89 (7) ◽  
pp. 583-586 ◽  
Author(s):  
Toshihiro Shimada ◽  
Yukito Furukawa ◽  
Etsuo Arakawa ◽  
Kunikazu Takeshita ◽  
Tadashi Matsushita ◽  
...  
Keyword(s):  
Structure Determination ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals SPECTROSCOPIC METHODS TO DETERMINATION OF GEOTHITE IN KAOLINITE

2020 ◽  
Vol 17 (35) ◽  
pp. 303-314
Author(s):  
Marcelo Kehl; ; ; ; DE SOUZA ◽  
Marcos Antônio KLUNK ◽  
Soyane Juceli Siqueira XAVIER ◽  
Mohuli DAS ◽  
Sudipta DASGUPTA
Keyword(s):  
Spectroscopic Methods ◽  
Industrial Minerals ◽  
X Ray Diffraction ◽  
Simple Shape ◽  
X Ray ◽  
Spectroscopic Monitoring ◽  
Partial Release ◽  
Primary Minerals

One of the main contaminants of kaolinite, the iron, directly impacts quality in its commercial value. The spectroscopic monitoring, measured the depth of absorption of kaolinite, is compared with the literature in order to identify possible contaminants. The occurrence of kaolinite is due to the formation of primary minerals after the partial release of cations and silicon. This clay-mineral has a simple shape, with variable crystallographic imperfections, especially in the presence of iron, which replaces aluminum in the mineral chain, causing various structural disorganizations. The extraction of industrial minerals combined with geological studies, allows the development of new sources of energy, such as clay minerals, in particular kaolinite. Depending on the origin of the kaolinites, the presence of iron oxides in its structure, Fe2O3 and FeO(OH), are common. By comparing the results of spectroscopy (X-ray fluorescence, X-ray diffraction, RAMAN) and imaging using SEM-EDS, it was possible to identify kaolinite, with a higher determination coefficient, when the proportion of kaolinite reaches 60% or more in the mix. Kaolinite can be identified and quantified with a high correlation in the mixture from the sample absorption. Thus, the method has great potential to assist in quantifying and, consequently, in discriminating the quality of kaolinite.

Three-Dimensional Molecular Packing of Thin Organic Films of PTCDI-C8Determined by Surface X-ray Diffraction

Langmuir ◽  
2008 ◽  
Vol 24 (22) ◽  
pp. 12742-12744 ◽  
Author(s):  
Tobias N. Krauss ◽  
Esther Barrena ◽  
Xue N. Zhang ◽  
Dimas G. de Oteyza ◽  
János Major ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Molecular Packing ◽  
Organic Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Thin Organic Films

Thermal Degradation of SiGe Interfaces Studied by X-Ray Reflectivity and Diffraction

1991 ◽  
Vol 239 ◽  
Author(s):  
J. M. Hudson ◽  
A. R. Powell ◽  
D. K. Bowen ◽  
M. Wormington ◽  
B. K. Tanner ◽  
...  
Keyword(s):  
Short Range ◽  
Grazing Incidence ◽  
Sige Layer ◽  
Interface Roughness ◽  
Total Thickness ◽  
X Ray Diffraction ◽  
X Ray ◽  
Surface And Interface ◽  
Superlattice Structures

ABSTRACTWe demonstrate the use of x-ray diffraction to provide accurate compositional information, together with grazing incidence reflectivity to provide information on layer thicknesses and surface and interface roughnesses, on Si/Si1-xGex superlattice structures of less than 200nm total thickness.The quality of SiGe interfaces has been investigated in superlattices where x varies from 0.1 to 0.5. At low Ge compositions the interfaces are shown to be smooth to a few angstroms. However, as the Ge composition in the SiGe layer approaches 50%, severe roughness is observed at the SiGe to Si interfaces, although the Si to SiGe interfaces remain relatively smooth.Upon annealing for one hour at 850°C the Ge diffuses outwards from the SiGe layers and can be closely modelled by inclusion of a (2.4±0.3)nm linearly graded layer either side of the SiGe layer into a simulation program. The long range roughness at the SiGe to Si interface is lost upon annealing leaving only a short range roughness of similar size to the Si to SiGe interface roughness.Reflectivity measurements have been shown to distinguish between interface roughness and interdiffusion for the annealed system.

Study of a chemical-vapor-deposited diamond thin film on a molybdenum substrate by glancing incidence X-ray diffraction

2007 ◽  
Vol 22 (4) ◽  
pp. 319-323 ◽  
Author(s):  
Jianfeng Fang ◽  
Jing Huo ◽  
Jinyuan Zhang ◽  
Yi Zheng
Keyword(s):  
Thin Film ◽  
Diffraction Analysis ◽  
Transition Layer ◽  
Chemical Vapor ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diamond Thin Film ◽  
Chemical Vapor Deposited

The structure of a chemical-vapor-deposited (CVD) diamond thin film on a Mo substrate was studied using quasi-parallel X-ray and glancing incidence techniques. Conventional X-ray diffraction analysis revealed that the sample consists of a diamond thin film, a Mo2C transition layer, and Mo substrate. The Mo2C transition layer was formed by a chemical reaction between the diamond film and the Mo substrate during the CVD process. A method for layer-thickness determination of the thin film and the transition layer was developed. This method was based on a relationship between X-ray diffraction intensities from the transition layer or its substrate and a function of grazing incidence angles. Results of glancing incidence X-ray diffraction analysis showed that thicknesses of the diamond thin film and the Mo2C transition layer were determined successfully with high precision.

scholarly journals STRUCTURAL AND MORPHOLOGICAL INVESTIGATION OF FUNCTIONALIZED REDUCED GRAPHENE OXIDE-MULTI WALLED CARBON NANOTUBES NANOCOMPOSITE

2020 ◽  
Vol 3 (3) ◽  
pp. 93
Author(s):  
Chandramani Upadhyay ◽  
Hanzala Shahzad ◽  
Mehreen Javid ◽  
Bhumika Soni ◽  
Tameem Ahmad ◽  
...  
Keyword(s):  
X Ray Diffraction ◽  
Effective Technique ◽  
X Ray ◽  
Reduced Graphene ◽  
Multi Walled Carbon Nanotubes ◽  
Walled Carbon Nanotubes ◽  
Probe Sonication ◽  
Prominent Peak

2D materials like Graphene and its composite has emerged as most valuable and major concern because of their peculiar properties in field of nanotechnology in past few decades. Herein, we report the effective technique for the synthesis of functionalized r-GO/MWCNTs nanocomposite using probe sonication. The synthesized samples were tested via XRD, FESEM, FTIR and Raman Spectroscopy. X-ray diffraction technique was used for the structural analysis of the samples which revealed that most prominent peak was observed around 2θ~26°. Surface morphology of the samples were studied via FESEM, which revealed that r-GO layers were wrapped around the MWCNTs. Raman spectra were recorded for the determination of quality of r-Go and MWCNT via the position and intensity of D and G band. The various functionalities present on the samples were identified via FTIR spectra.

scholarly journals Structural Determination of the Epitaxial C60 Overlayer on the Pentacene Single Crystal by Grazing Incidence X-ray Diffraction

Hyomen Kagaku ◽  
2016 ◽  
Vol 37 (9) ◽  
pp. 429-434 ◽  
Author(s):  
Ryohei TSURUTA ◽  
Yuta MIZUNO ◽  
Takuya HOSOKAI ◽  
Tomoyuki KOGANEZAWA ◽  
Hisao ISHII ◽  
...  
Keyword(s):  
Single Crystal ◽  
Grazing Incidence ◽  
Structural Determination ◽  
X Ray Diffraction ◽  
X Ray
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