Fast quantitative analysis of strong uniaxial texture using a March–Dollase approach

2013 ◽  
Vol 46 (6) ◽  
pp. 1877-1879 ◽  
Author(s):  
Emil Zolotoyabko
Keyword(s):  
Quantitative Analysis ◽  
Intensity Ratio ◽  
Preferred Orientation ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
X Ray ◽  
Diffraction Peaks ◽  
Analytical Expressions

Interrelations between the degree of uniaxial preferred orientation and the intensities and widths of selected X-ray diffraction peaks are analyzed within the March–Dollase approach. Simple analytical expressions are developed which relate the degree of preferred orientation to the rocking curve width of the strongest diffraction peak or the intensity ratio of two diffraction peaks, one of them being originated in the preferably orientated atomic planes.

Effect of Sputtering Pressure on the Formation of Semiconducting Mg2Si Films

2010 ◽  
Vol 663-665 ◽  
pp. 166-169
Author(s):  
Qing Quan Xiao ◽  
Quan Xie ◽  
Ke Jie Zhao ◽  
Zhi Qiang Yu
Keyword(s):  
Film Growth ◽  
Diffraction Peak ◽  
Morphological Properties ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Intensity ◽  
Main Diffraction Peak ◽  
Diffraction Peaks ◽  
Si Films ◽  
Sputtering Pressure

Semiconducting Mg2Si films were fabricated on Si (111) substrates by magnetron sputtering and subsequent annealing, and the effects of sputtering pressure on the Mg2Si film growth were studied. The structural and morphological properties of Mg2Si films were investigated by the means of X-ray diffraction (XRD) and scanning electron microscopy (SEM). The results showed that the Mg2Si (220) main diffraction peak intensity increased and then decreased with the increasing of sputtering pressure. The (220) diffraction peak got its maximum at 3.0 Pa sputtering pressure. The intensity of Mg2Si (200) and (400) diffraction peaks increased rapidly as the sputtering pressure decreased when the pressure was lower than 1.5 Pa. The films prepared at higher sputtering pressure had very irregular microstructures, and the surface of semiconducting Mg2Si films became smoother with the decreasing of the sputtering pressure.

Microbeam X-ray diffraction from twisted lamellar crystals: theory and computer simulation

2009 ◽  
Vol 42 (4) ◽  
pp. 673-680 ◽  
Author(s):  
Valeriy A. Luchnikov ◽  
Dimitri A. Ivanov
Keyword(s):  
Basal Plane ◽  
Peak Position ◽  
Diffraction Peak ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening ◽  
Asymmetric Shape ◽  
Diffraction Peaks ◽  
Lamellar Crystals

The diffraction peak position, width and intensity distribution are calculated for the case of a helicoidally twisted crystalline lamella, both analytically and numerically. It is shown that the diffraction peak broadening depends on the orientation of the corresponding reciprocal-space vector with respect to the helicoid axis and the normal to the lamellar basal plane. The equatorial peaks, which are close to the normal direction to the lamellar basal plane, are characterized by the highest azimuthal width. By contrast, the reflections positioned close to the lamellar surface have the smallest azimuthal width. For non-equatorial peaks in the proximity of the twisting axis the intensity has an unusual asymmetric shape. The shape of the microbeam, as well as its position and direction with respect to the lamella, influences the shape of the diffraction peaks in reciprocal space and their appearance in two-dimensional diffractograms. The proposed approach can be useful, for example, for the interpretation of microbeam diffractograms of banded polymer spherulites.

scholarly journals Quantitative Analysis of Phases in Zeolite Bearing Rocks from Full X-ray Diffraction Profiles

1988 ◽  
Vol 41 (2) ◽  
pp. 323 ◽  
Author(s):  
JC Taylor ◽  
SR Pecover
Keyword(s):  
Quantitative Analysis ◽  
Epoxy Resin ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Field Samples ◽  
Al Powder ◽  
Mineral Mixtures

It is shown that quantitative analysis of zeolite phases in mineral mixtures can be performed using calculated whole-pattern X-ray diffraction profiles and Bragg-Brentano patterns. The method was tested on binary and ternary standard mixtures containing quartz, heulandite, chabazite and stellerite, and gave zeolite weight percentages correct to within a few per cent. Structure analyses of the zeolites were necessary to obtain good calculated profiles. The platy zeolites heulimdite and stellerite had severe preferred orientation problems, which were minimised experimentally by adding Al powder diluent and an epoxy resin, and regrinding. Analyses of field samples are also described.

scholarly journals Stress Gradients and Anisotropy in Thin Films

1988 ◽  
Vol 130 ◽  
Author(s):  
Robert M. Fisher ◽  
J. Z. Duan ◽  
Alan G. Fox
Keyword(s):  
Thin Films ◽  
Film Surface ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Thickness Strain ◽  
Strain Gradients ◽  
X Ray ◽  
Stress Gradients ◽  
Diffraction Peaks ◽  
Chromium Films

AbstractIndications that steep through-thickness strain gradients occur in vapour-deposited chromium films stemming from previous observations of film curling during spontaneous delamination from substrates, have been substantiated by analysis and simulation of Bragg X-Ray diffraction peaks. The presence of large through-thickness compressive strains, that increase quadratically with distance from the substrate from about zero at the interface to around 0.8% at the film surface, was deduced by empirical computer matching of diffraction peak shapes.

Quantitative Analysis of Sedimentary Minerals by Powder X-ray Diffraction

1986 ◽  
Vol 1 (2) ◽  
pp. 37-39 ◽  
Author(s):  
Peter Bayliss
Keyword(s):  
Quantitative Analysis ◽  
Crystallite Size ◽  
Sedimentary Environment ◽  
Preferred Orientation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Primary Extinction ◽  
Geological Formation ◽  
Analytical Procedures

AbstractThe variables of reflection overlap, crystallinity and crystallite size, primary extinction, microabsorption, chemical substitutions, preferred orientation, and analytical procedures affect quantitative analysis by powder X-ray diffraction. The intensity of the strongest reflection (I) of 39 minerals from a typical sedimentary environment divided by the intensity of the strongest reflection (Ic) of corundum, I/Ic, may be used to determine mineral percentages. Because of the numerous variables mentioned above, the I/Ic ratios used should be taken from multi-mineral specimens that occur either in the same geological formation for quantitative analysis (±7%) or in a similar geological formation for quantitative analysis (±30%).

An improved method for quantitative analysis of sedimentary minerals by X-ray diffraction

1996 ◽  
Vol 11 (3) ◽  
pp. 235-239 ◽  
Author(s):  
Wang Chao ◽  
Pan Chunde ◽  
Wang Daqing ◽  
Song Aixia ◽  
Nie Jihong ◽  
...  
Keyword(s):  
Quantitative Analysis ◽  
Preferred Orientation ◽  
Improved Method ◽  
X Ray Diffraction ◽  
Absolute Deviation ◽  
X Ray ◽  
Sedimentary Environments ◽  
Loading Method ◽  
Intensity Ratios ◽  
Comparison Of The Results

An improved backloading method to determine the reference intensity ratios of sedimentary minerals is presented. More than 50 reference intensity ratios of more than ten types of minerals formed in typical sedimentary environments were measured. Quantitative tests were performed on those minerals. Comparison of the results show that this method minimizes preferred orientation and improves quantitative precision (absolute deviation is less than 3%) so that it is an acceptable specimen loading method.

X-Ray Diffraction Characteristics of Kovar Alloy and Al2O3 Ceramics

2016 ◽  
Vol 872 ◽  
pp. 123-127
Author(s):  
Qi Le Gao ◽  
Yi Liang Zhang ◽  
Jun Ming Zhou ◽  
Jia Gen Peng ◽  
Shou Liang Hu
Keyword(s):  
Residual Stress ◽  
Calibration Method ◽  
Diffraction Peak ◽  
Strain Gauges ◽  
X Ray Diffraction ◽  
X Ray ◽  
Constant Strength ◽  
Diffraction Peaks ◽  
Theoretical Results ◽  
Kovar Alloy

In order to study the residual stress of Al2O3 ceramics and kovar alloy after brazing, this article conducted both X-ray diffraction and strain gauges measurement. Using Stress diffractometer and constant strength beam calibration method to examine the x-ray diffraction characteristics of these two materials. And compare measured results and theoretical results. It is shows that the Al2O3 ceramics has two obvious diffraction peaks in 140°~170°, where the diffraction peak at 2θ=153° can reflect the changes of stress more accurately then one at 2θ=146°. For kovar alloy, there is only one diffraction peak at 2θ=149° in range of 140°~170° and it has good linear relationship with stress.

scholarly journals The suppression of fluorescence peaks in energy-dispersive X-ray diffraction

2014 ◽  
Vol 47 (5) ◽  
pp. 1708-1715 ◽  
Author(s):  
G. M. Hansford ◽  
S. M. R. Turner ◽  
D. Staab ◽  
D. Vernon
Keyword(s):  
Excitation Energy ◽  
Preferred Orientation ◽  
Energy Dispersive ◽  
Source Spectrum ◽  
Natural State ◽  
X Ray Diffraction ◽  
Scattering Angle ◽  
X Ray ◽  
Back Reflection ◽  
Diffraction Peaks

A novel method to separate diffraction and fluorescence peaks in energy-dispersive X-ray diffraction (EDXRD) is described. By tuning the excitation energy of an X-ray tube source to just below an elemental absorption edge, the corresponding fluorescence peaks of that element are completely suppressed in the resulting spectrum. SinceBremsstrahlungphotons are present in the source spectrum up to the excitation energy, any diffraction peaks that lie at similar energies to the suppressed fluorescence peaks are uncovered. This technique is an alternative to the more usual method in EDXRD of altering the scattering angle in order to shift the energies of the diffraction peaks. However, in the back-reflection EDXRD technique [Hansford (2011).J. Appl. Cryst.44, 514–525] changing the scattering angle would lose the unique property of insensitivity to sample morphology and is therefore an unattractive option. The use of fluorescence suppression to reveal diffraction peaks is demonstrated experimentally by suppressing the Ca Kfluorescence peaks in the back-reflection EDXRD spectra of several limestones and dolomites. Three substantial benefits are derived: uncovering of diffraction peak(s) that are otherwise obscured by fluorescence; suppression of the Ca Kescape peaks; and an increase in the signal-to-background ratio. The improvement in the quality of the EDXRD spectrum allows the identification of a secondary mineral in the samples, where present. The results for a pressed-powder pellet of the geological standard JDo-1 (dolomite) show the presence of crystallite preferred orientation in this prepared sample. Preferred orientation is absent in several unprepared limestone and dolomite rock specimens, illustrating an advantage of the observation of rocks in their natural state enabled by back-reflection EDXRD.

Effect of Hydration Products Transformation for Compressive Strength of Autoclaved Silicate Products

2012 ◽  
Vol 204-208 ◽  
pp. 3644-3647
Author(s):  
Chang Jun Ke ◽  
Shu Ying Wang ◽  
Jun Li Liu
Keyword(s):  
Compressive Strength ◽  
Steam Pressure ◽  
Diffraction Peak ◽  
Saturated Steam ◽  
Hydration Products ◽  
X Ray Diffraction ◽  
Spectroscopy Analysis ◽  
X Ray ◽  
Diffraction Peaks ◽  
The Relationship

the relationship between hydration products transformation and the compressive strength was studied with X-ray diffraction, infrared spectroscopy analysis. The results showed, 0.505nm hydrogarnets diffraction peaks weakened and 0.183nm CSH diffraction peak enhanced with different autoclaved time under 1.2MPa saturated steam pressure. 0.505nm hydrogarnets diffraction peak enhanced under lower saturated steam pressure for autoclaving 6h, then weaken under higher saturated steam pressure. And 0.183nm CSH diffraction peaks enhanced with different saturated steam pressure for autoclaving 6h. During autoclaving, hydrogarnet translate into Al-substituted calcium silicate hydrate (C-S-H). Transformation of hydration products is favorable for compressive strength of autoclaved sample.

scholarly journals Identification of preferentially exposed crystal facets by X-ray diffraction

RSC Advances ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 5585-5589 ◽  
Author(s):  
Liping Zhang ◽  
Alexandre A. S. Gonçalves ◽  
Mietek Jaroniec
Keyword(s):  
Preferred Orientation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Peaks ◽  
Exposed Facets ◽  
Anisotropic Nanostructures

Intensification of X-ray diffraction peaks can be used to get information about doping, presence of vacancies, anisotropic nanostructures, or preferred orientation of crystals with largely exposed facets.

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