Higher-order suppression in diffraction-grating monochromators using thin films

1998 ◽  
Vol 5 (3) ◽  
pp. 783-785 ◽  
Author(s):  
F. M. Quinn ◽  
D. Teehan ◽  
M. MacDonald ◽  
S. Downes ◽  
P. Bailey

Although a continuously tuneable source of photons is a very desirable feature of synchrotron radiation it has one main drawback: the contamination of the photon beam by higher-order diffracted light. Several elements have absorption edges which lie between 10 and 200 eV, a range prone to high second- and third-order content in XUV monochromators. They can, therefore, be used as transmission filters to reduce this higher-order content. This paper describes the use of thin filters to reduce the higher-order content in diffraction-grating monochromators. Their suppression efficiency, transmission and ageing have been characterized using photoelectron spectroscopy and compared with calculated values. The effect of oxide contamination on their performance has been assessed. Filters are now installed on eight XUV beamlines and have been in routine use for several years.

2019 ◽  
Vol 35 (8) ◽  
pp. 141-150 ◽  
Author(s):  
Andres G. Muñoz ◽  
Christian Heine ◽  
Hagen W. Klemm ◽  
Thomas Hannappel ◽  
Nadine Szabo ◽  
...  

2001 ◽  
Vol 486 (1-2) ◽  
pp. 55-64 ◽  
Author(s):  
L Giovanelli ◽  
H Von Schenck ◽  
M Sinner-Hettenbach ◽  
N Papageorgiou ◽  
M Göthelid ◽  
...  

2001 ◽  
Vol 482-485 ◽  
pp. 1199-1204 ◽  
Author(s):  
N. Papageorgiou ◽  
L. Giovanelli ◽  
J.B. Faure ◽  
J.M. Layet ◽  
M. Göthelid ◽  
...  

2009 ◽  
Vol 1155 ◽  
Author(s):  
Mario El Kazzi ◽  
Clement Merckling ◽  
Genevieve Grenet ◽  
Guillaume Saint-Girons ◽  
Mathieu Silly ◽  
...  

AbstractHigh-resolution synchrotron radiation X-ray photoelectron spectroscopy (HRXPS) is used to study the chemical bonding at the Al2O3/Si(001) and Al2O3/Si(111) interfaces. In both cases, the Si2p spectra recorded at 180 eV photon energy provides evidence a thin interfacial layer rich in Si-O bonding. On the other hand, conventional AlKα X-ray source angular measurements clearly indicate that there are two in-plane orientations for Al2O3/Si(111) : [11-2]Al2O3(111)//[11-2]Si(111) and [-1-12] Al2O3(111)//[11-2]Si(111) but four in-plane orientations for Al2O3/Si(001) : [11-2] Al2O3(111)//[100]Si(001), [11-2]Al2O3(111)//[010]Si(001), [11-2]Al2O3(111)//[-100]Si(001), and [11-2]Al2O3(111)//[0-10]Si(001).


2017 ◽  
Vol 19 (18) ◽  
pp. 11549-11553 ◽  
Author(s):  
Matthias Franke ◽  
Daniel Wechsler ◽  
Quratulain Tariq ◽  
Michael Röckert ◽  
Liang Zhang ◽  
...  

We have investigated the interactions between cobalt(ii)-tetraphenylporphyrin molecules and MgO(100) thin films on Ag(100) by means of synchrotron radiation X-ray and ultra-violet photoelectron spectroscopy.


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