Nanofabrication and characterization of a grating-based condenser for uniform illumination with hard X-rays

2017 ◽  
Vol 24 (3) ◽  
pp. 595-599
Author(s):  
Jianpeng Liu ◽  
Xin Li ◽  
Shuo Chen ◽  
Sichao Zhang ◽  
Shanshan Xie ◽  
...  
Keyword(s):  
Finite Difference Time Domain ◽  
Optical Characterization ◽  
X Rays ◽  
Uniform Illumination ◽  
Basic Study ◽  
Full Field ◽  
X Ray ◽  
High Uniformity ◽  
Difference Time

In the development of full-field transmission X-ray microscopy for basic study in science and technology, a condenser capable of providing intense illumination with high uniformity and stability on tested specimens in order to achieve high-quality images is essential. The latest design of a square-shaped condenser based on diffractive gratings has demonstrated promising uniformity in illumination. This paper describes in more detail the development of such a beam shaper for hard X-rays at 10 keV with regard to its design, manufacture and optical characterization. The effect of the grating profile on the diffracted intensity has been theoretically predicted by numerical simulation using the finite-difference time-domain method. Based on this, the limitations of the grating-based condenser are discussed.

DIFFERENTIAL INTERFERENCE CONTRAST FOR X-RAY MICROSCOPY: FABRICATION AND CHARACTERIZATION OF TWIN ZONE PLATE OPTICS

2002 ◽  
Vol 09 (01) ◽  
pp. 243-248 ◽  
Author(s):  
ENZO DI FABRIZIO ◽  
BURKHARD KAULICH ◽  
THOMAS WILHEIN ◽  
JEAN SUSINI
Keyword(s):  
Photon Energy ◽  
Differential Interference Contrast ◽  
X Rays ◽  
Full Field ◽  
X Ray ◽  
Nomarski Differential Interference Contrast ◽  
Scanning Transmission ◽  
Imaging Performance ◽  
Dic Technique

A novel X-ray technique for converting the phase information of weakly absorbing specimen into strong image contrast similar to Nomarski differential interference contrast (DIC) is presented. DIC for X-rays is accomplished by the fabrication of a novel X-ray optic (TZP) consisting of two zone plates (ZPs) on both sides of the same substrate, laterally shifted by about one outermost zone width. The feasibility of DIC for X-rays was proven at the ID 21 X-ray microscopy beamline at the ESRF using a full-field imaging microscope and a scanning transmission X-ray microscope, which were operated at 4 keV photon energy. In both microscopes, we observe a tremendous contrast enhancement of up to a factor of 25. Though first experiments were carried out at 4 keV photon energy, this X-ray DIC technique can be adapted to any photon energy where ZPs with appropriate parameters and imaging performance can be designed and manufactured.

Digital x-ray mapping of nanometer-size supported bimetallic catalysts

1988 ◽  
Vol 46 ◽  
pp. 530-531
Author(s):  
L. T. Germinario
Keyword(s):  
Background Radiation ◽  
Metal Cluster ◽  
Single Element ◽  
Beam Diameter ◽  
X Rays ◽  
X Ray ◽  
Major Interest ◽  
Induced Changes

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.

scholarly journals Integration of Dental Implants in Conjunction with EDTA-Conditioned Dentin Grafts: An Experimental Study

2021 ◽  
Vol 9 (6) ◽  
pp. 63
Author(s):  
Payam Farzad ◽  
Ted Lundgren ◽  
Adel Al-Asfour ◽  
Lars Andersson ◽  
Christer Dahlin
Keyword(s):  
Direct Contact ◽  
Mineral Content ◽  
X Rays ◽  
X Ray ◽  
Dentin Surface ◽  
Significant Difference ◽  
C And N ◽  
Micro Implants ◽  
Demineralized Dentin

This study was undertaken to investigate the integration of titanium micro-implants installed in conjunction with previously dentin-grafted areas and to study the morphological appearance, mineral content, and healing pattern of xenogenic EDTA-conditioned dentin blocks and granules grafted to cavities in the tibial bone of rabbits. Demineralized and non-demineralized dentin blocks and granules from human premolars were implanted into cavities prepared on the lateral aspects of the tibias of rabbits. After a healing period of six months, micro-implants were installed at each surgical site. Histological examinations were carried out after 24 weeks. Characterization of the EDTA-conditioned dentin blocks was performed by means of light microscopy, dental X-rays, scanning electron microscopy, and energy dispersive X-ray analysis (EDX). No implants were found to be integrated in direct contact with the dentin particles or blocks. On the EDTA-conditioned dentin surface, the organic marker elements C and N dominated, as revealed by EDX. The hydroxyapatite constituents Ca and P were almost absent on the dentin surface. No statistically significant difference was observed between the EDTA-conditioned and non-demineralized dentin, as revealed by BIC and BA. The bone-inductive capacity of the dentin material seemed limited, although demineralization by means of EDTA indicated higher BIC and BA values in conjunction with the installed implants in the area. A 12 h EDTA treatment did not fully decalcify the grafts, as revealed by X-ray analysis.

Structural and Optical Characterization of Zinc Telluride Thin Films

2013 ◽  
Vol 665 ◽  
pp. 254-262 ◽  
Author(s):  
J.R. Rathod ◽  
Haresh S. Patel ◽  
K.D. Patel ◽  
V.M. Pathak
Keyword(s):  
Thin Films ◽  
Extinction Coefficient ◽  
Nir Spectroscopy ◽  
Optical Characterization ◽  
X Ray Diffraction ◽  
X Ray ◽  
Evaporation Technique ◽  
Film Form ◽  
Znte Thin Films

Group II-VI compounds have been investigated largely in last two decades due to their interesting optoelectronic properties. ZnTe, a member of this family, possesses a bandgap around 2.26eV. This material is now a day investigated in thin film form due to its potential towards various viable applications. In this paper, the authors report their investigations on the preparation of ZnTe thin films using vacuum evaporation technique and their structural and optical characterizations. The structural characterization, carried out using an X-ray diffraction (XRD) technique shows that ZnTe used in present case possesses a cubic structure. Using the same data, the micro strain and dislocation density were evaluated and found to be around 1.465×10-3lines-m2and 1.639×1015lines/m2respecctively. The optical characterization carried out in UV-VIS-NIR region reveals the fact that band gap of ZnTe is around 2.2eV in present case. In addition to this, it was observed that the value of bandgap decreases as the thickness of films increases. The direct transitions of the carries are involved in ZnTe. Using the data of UV-VIS-NIR spectroscopy, the transmission coefficient and extinction coefficient were also calculated for ZnTe thin films. Besides, the variation of extinction coefficient with wavelength has also been discussed here.

Sign in / Sign up

Export Citation Format

Share Document