scholarly journals Interface modification of Cr/Ti multilayers with C barrier layer for enhanced reflectivity in the water window regime

2021 ◽  
Vol 28 (1) ◽  
pp. 224-230
Author(s):  
P. Sarkar ◽  
A. Biswas ◽  
N. Abharana ◽  
S. Rai ◽  
M. H. Modi ◽  
...  
Keyword(s):  
Barrier Layer ◽  
Grazing Angle ◽  
Grazing Incidence ◽  
Angle Of Incidence ◽  
Interface Modification ◽  
X Ray ◽  
Barrier Layers ◽  
Water Window ◽  
Dimensional Growth ◽  
X Ray Absorption

The influence of a carbon barrier layer to improve the reflectivity of Cr/Ti multilayers, intended to be used in the water window wavelength regime, is investigated. Specular grazing-incidence X-ray reflectivity results of Cr/Ti multilayers with 10 bilayers show that interface widths are reduced to ∼0.24 nm upon introduction of a ∼0.3 nm C barrier layer at each Cr-on-Ti interface. As the number of bilayers increases to 75, a multilayer with C barrier layers maintains almost the same interface widths with no cumulative increase in interface imperfections. Using such interface-engineered Cr/C/Ti multilayers, a remarkably high soft X-ray reflectivity of ∼31.6% is achieved at a wavelength of 2.77 nm and at a grazing angle of incidence of 16.2°, which is the highest reflectivity reported so far in the literature in this wavelength regime. Further investigation of the multilayers by diffused grazing-incidence X-ray reflectivity and grazing-incidence extended X-ray absorption fine-structure measurements using synchrotron radiation suggests that the improvement in interface microstructure can be attributed to significant suppression of inter-diffusion at Cr/Ti interfaces by the introduction of C barrier layers and also due to the smoothing effect of the C layer promoting two-dimensional growth of the multilayer.

scholarly journals Revealing noncollinear magnetic ordering at the atomic scale via XMCD

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Fridtjof Kielgast ◽  
Ivan Baev ◽  
Torben Beeck ◽  
Federico Pressacco ◽  
Michael Martins
Keyword(s):  
Ground State ◽  
Magnetic Circular Dichroism ◽  
Magnetic Moments ◽  
Magnetic Ordering ◽  
Atomic Scale ◽  
Angle Of Incidence ◽  
X Ray ◽  
First Time ◽  
X Ray Absorption ◽  
Magnetic Sublattices

AbstractMass-selected V and Fe monomers, as well as the heterodimer $${\text{Fe}}_1{\text{V}}_1$$ Fe 1 V 1 , were deposited on a Cu(001) surface. Their electronic and magnetic properties were investigated via X-ray absorption (XAS) and X-ray magnetic circular dichroism (XMCD) spectroscopy. Anisotropies in the magnetic moments of the deposited species could be examined by means of angle resolving XMCD, i.e. changing the X-ray angle of incidence. A weak adatom-substrate-coupling was found for both elements and, using group theoretical arguments, the ground state symmetries of the adatoms were determined. For the dimer, a switching from antiparallel to parallel orientation of the respective magnetic moments was observed. We show that this is due to the existence of a noncollinear spin-flop phase in the deposited dimers, which could be observed for the first time in such a small system. Making use of the two magnetic sublattices model, we were able to find the relative orientations for the dimer magnetic moments for different incidence angles.

scholarly journals In Situ Investigation of the Early-Stage Growth of Nanoporous Alumina

2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
Thérèse Gorisse ◽  
Ludovic Dupré ◽  
Marc Zelsmann ◽  
Alina Vlad ◽  
Alessandro Coati ◽  
...  
Keyword(s):  
Early Stage ◽  
Grazing Incidence ◽  
Alumina Layer ◽  
Nanoporous Alumina ◽  
X Ray ◽  
X Ray Scattering ◽  
In Situ Investigation ◽  
Low X ◽  
X Ray Absorption

We report the successful use of in situ grazing incidence small-angle X-ray scattering to follow the anodization of aluminum. A dedicated electrochemical cell was designed and developed for this purpose with low X-ray absorption, with the possibility to access all azimuthal angles (360°) and to remotely control the temperature of the electrolyte. Three well-known fabrication techniques of nanoporous alumina, i.e., single, double, and pretextured, were investigated. The differences in the evolution of the scattering images are described and explained. From these measurements, we could determine at which moment the pores start growing even for very short anodization times. Furthermore, we could follow the thickness of the alumina layer as a function of the anodization time by monitoring the period of the Kiessig fringes. This work is aimed at helping to understand the different steps taking place during the anodization of aluminum at the very early stages of nanoporous alumina formation.

Tracking chemical reaction using soft–X–Ray absorption spectroscopy with a table-top water-window X-ray source

2021 ◽  
Author(s):  
Tadas Balciunas ◽  
Yi-Ping Chang ◽  
Zhong Yin ◽  
Cédric Schmidt ◽  
Kristina Zinchenko ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Chemical Reaction ◽  
X Ray ◽  
Water Window ◽  
X Ray Absorption

X-Ray Grazing Angle Scattering and Fluorescence Studies of Interfacial Microstructures in Si1-xGex/Si Multilayers

1992 ◽  
Vol 280 ◽  
Author(s):  
Z. H. Ming ◽  
A. Krol ◽  
Y. L. Soo ◽  
Y. H. Kao ◽  
J. S. Park ◽  
...  
Keyword(s):  
Angular Dependence ◽  
Grazing Angle ◽  
Grazing Incidence ◽  
Fluorescence Yield ◽  
Interfacial Roughness ◽  
Density Profiles ◽  
X Ray ◽  
Fluorescence Studies ◽  
X Ray Scattering ◽  
Angle Scattering

ABSTRACTAngular dependence of grazing incidence x-ray scattering and Ge fluorescence yield were measured for the heterostructures of Si1-xGex/Si and the inverted bilayer Si/Si1-xGex as well as two 10-period superlattices. Interfacial roughness, correlation of height fluctuations between interfaces and Ge density profiles in the multilayers were investigated.

Grazing Incidence X-ray Fluorescence Analysis with Monochromatic Radiation

1990 ◽  
Vol 34 ◽  
pp. 71-80 ◽  
Author(s):  
Manfred Schuster
Keyword(s):  
Penetration Depth ◽  
Fluorescence Intensity ◽  
Dopant Concentration ◽  
Fluorescence Analysis ◽  
Analytical Description ◽  
Grazing Incidence ◽  
Concentration Profiles ◽  
Angle Of Incidence ◽  
X Ray ◽  
Si Wafer

AbstractX-ray fluorescence excited by a monochromatic collimated Mo-Kα beam at grazing incidence is measured as a function of the angle of incidence. Monochromatic excitation guarantees a well-defined penetration depth and enables a simple analytical description of the fluorescence intensity. This method is applied to a system of thin Cu and Ti metallization layers on a Si wafer and to As dopant concentration profiles in Si wafers.Thereby, the effect of annealing can be analyzed non-destructively.

In Situ Grazing-Incidence Extended X-ray Absorption Fine Structure Study of Pb(II) Chemisorption on Hematite (0001) and (1-102) Surfaces

Langmuir ◽  
2004 ◽  
Vol 20 (5) ◽  
pp. 1667-1673 ◽  
Author(s):  
John R. Bargar ◽  
Thomas P. Trainor ◽  
Jeffery P. Fitts ◽  
Scott A. Chambers ◽  
Gordon E. Brown
Keyword(s):  
Fine Structure ◽  
Grazing Incidence ◽  
Structure Study ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption
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