Investigation on electron and hole transport properties using the full-band spherical-harmonics expansion method

1998 ◽  
Vol 45 (9) ◽  
pp. 2010-2017 ◽  
Author(s):  
S. Reggiani ◽  
M.C. Vecchi ◽  
M. Rudan



VLSI Design ◽  
1998 ◽  
Vol 8 (1-4) ◽  
pp. 361-365 ◽  
Author(s):  
Susanna Reggiani ◽  
Maria Cristina Vecchi ◽  
Massimo Rudan

By adopting the solution method for the BTE based on the spherical-harmonics expansion (SHE) [1], and using the full-band structure for both the electron and valence band of silicon [2], the temperature dependence of a number of scattering mechanisms has been modeled and implemented into the code HARM performing the SHE solution. Comparisons with the experimental mobility data show agreement over a wide range of temperatures. The analysis points out a number of factors from which the difficulties encountered in earlier investigations seemingly originate, particularly in the case of hole mobility.







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