In-situ preparation of superconducting Bi-Sr-Ca-Cu-O thin films by high pressure DC sputtering

1991 ◽  
Vol 27 (2) ◽  
pp. 1560-1563 ◽  
Author(s):  
R.J. Lin ◽  
P.T. Wu
1992 ◽  
Vol 195 (3-4) ◽  
pp. 258-262 ◽  
Author(s):  
P. Wagner ◽  
H. Adrian ◽  
C. Tomé-Rosa

1992 ◽  
Vol 06 (08) ◽  
pp. 477-483 ◽  
Author(s):  
QINGXIN SU ◽  
SHIFA XU ◽  
DAFU CUI ◽  
HUIBIN LU ◽  
YONGJUN TIAN ◽  
...  

High-T c superconducting thin films of YBa 2 Cu 3 O 7 were grown in-situ on (100) SrTiO 3 substrates by Nedymium:yttrium aluminum garnet [Nd:YAG] laser ablation. The effects of the substrate temperature on the transition temperature, microcrystalline structure and surface morphology of the films were discussed. Best results were obtained in the 730°–770°C range. X-ray diffraction analysis showed that these films were highly c-oriented with the c-axis perpendicular to the substrate surface. At the optimum substrate temperature, a very smooth morphology with only a few small particles were observed by scanning electron microscopy. The zero resistance temperature of these films were ≥ 90 K with a narrow transition width and the ac susceptibility measurement also gave the same result. The highest critical current density obtained at 77 K and zero magnetic field was 3.8 × 106 A/cm 2.


1991 ◽  
Vol 27 (2) ◽  
pp. 1475-1478 ◽  
Author(s):  
M.I. Faley ◽  
M.E. Gershenson ◽  
N.P. Kuchta ◽  
V.S. Salun

1992 ◽  
Vol 275 ◽  
Author(s):  
H. Ohlsén ◽  
M. Ottosson ◽  
J. Hudner ◽  
M. ÖStling ◽  
L. Stolt ◽  
...  

ABSTRACTThin films of YBCO were prepared using a mass-spectrometer controlled coevapora-tion/MBE process with atomic oxygen. Under the conditions of low pressure, necessary for mass-spectrometer rate control, it is shown that an atomic oxygen beam source can be utilized in order to grow high quality thin films of YBCO as well as multi-layer structures involving YBCO and Y2O3. Values of Tc = 88.5 K and Jc = 6–106 A/cm2 at 77 K were determined for a strip with a width of 10 μm of YBCO deposited on a LaAlO3 substrate. Film structure is analyzed by XRD and rocking curve measurements. Magnetic characterization of films and multi-layer structures are reported.


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