Automatic built-in self-test insertion for high level circuit descriptions
International Journal of Advanced Research in Electrical Electronics and Instrumentation Engineering
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2014 ◽
Vol 03
(08)
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pp. 11487-11495
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2019 ◽
Vol 24
(3)
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pp. 239-247
2021 ◽
Vol 26
(3)
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pp. 1-18
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