Relativistic generation and characterization of ultrafast X-rays for time-resolved diffraction and spectroscopy

Author(s):  
T. Guo ◽  
C. Spielmann ◽  
C.W. Siders ◽  
A. Cavalleri ◽  
K.R. Wilson ◽  
...  
Keyword(s):  
X Rays ◽  
2021 ◽  
Vol 54 (6) ◽  
Author(s):  
Cedric J. Gommes ◽  
Sebastian Jaksch ◽  
Henrich Frielinghaus

Many experimental methods are available for the characterization of nanostructures, but most of them are limited by stringent experimental conditions. When it comes to analysing nanostructures in the bulk or in their natural environment – even as ordinary as water at room temperature – small-angle scattering (SAS) of X-rays or neutrons is often the only option. The rapid worldwide development of synchrotron and neutron facilities over recent decades has opened unprecedented possibilities for using SAS in situ and in a time-resolved way. But, in spite of its huge potential in the field of nanomaterials in general, SAS is covered far less than other characterization methods in non-specialized curricula. Presented here is a rigorous discussion of small-angle scattering, at a technical level comparable to the classical undergraduate coverage of X-ray diffraction by crystals and which contains diffraction as a particular case.


2021 ◽  
Vol 11 (23) ◽  
pp. 11173
Author(s):  
Alexandros Skoulakis ◽  
Evaggelos Kaselouris ◽  
Antonis Kavroulakis ◽  
Christos Karvounis ◽  
Ioannis Fitilis ◽  
...  

An X-pinch scheme of a low-current generator (45 kA, 50 ns rise time) is characterized as a potential efficient source of soft X-rays. The X-pinch target consists of wires of 5 μm in diameter—made from either tungsten (W) or gold (Au)-plated W—loaded at two angles of 55° and 98° between the crossed wires. Time-resolved soft X-ray emission measurements are performed to provide a secure correlation with the optical probing results. A reconstruction of the actual photodiode current profile procedure was adopted, capable of overcoming the limits of the slow rising and falling times due to the “slow” response of the diodes and the noise. The pure and Au-plated W deliver an average X-ray yield, which depends only on the angle of the crossed wires, and is measured to be ~50 mJ and ~70 mJ for the 98° and 55° crossed wire angles, respectively. An additional experimental setup was developed to characterize the X-pinch as a source of X-rays with energy higher than ~6 keV, via time-integrated measurements. The X-ray emission spectrum was found to have an upper limit at 13 keV for the Au-plated W configuration at 55°. The portable tabletop X-pinch proved to be ideal for use in X-ray radiography applications, such as the detection of interior defects in biological samples.


2019 ◽  
Vol 3 (4) ◽  
pp. 241-248 ◽  
Author(s):  
Gamal M. Elaragi

In this paper, Egyptian first inertial electrostatic confinement fusion (IECF) device, constructed at the Egyptian Atomic Energy Authority (EAEA-IEC), is introduced the characterization of IEC Plasma Device. It consists of 2.8 cm stainless steel cathode, 6.5 cm anode diameter with 10 cm diameter 30 cm height vacuum chamber. The discharge current and voltage of plasma discharge has been recorded using current probe and resistive voltage divider respectively. The X-ray emissions in IEC plasma device were investigated by employing time-resolved detector. The temporal distributions of detected x-rays emission are occurring during the initial 1 microsecond. The calculated rate of DD-neutron generation using the same electrode configuration about 106 – 108 neutrons/second.


Author(s):  
L. T. Germinario

Understanding the role of metal cluster composition in determining catalytic selectivity and activity is of major interest in heterogeneous catalysis. The electron microscope is well established as a powerful tool for ultrastructural and compositional characterization of support and catalyst. Because the spatial resolution of x-ray microanalysis is defined by the smallest beam diameter into which the required number of electrons can be focused, the dedicated STEM with FEG is the instrument of choice. The main sources of errors in energy dispersive x-ray analysis (EDS) are: (1) beam-induced changes in specimen composition, (2) specimen drift, (3) instrumental factors which produce background radiation, and (4) basic statistical limitations which result in the detection of a finite number of x-ray photons. Digital beam techniques have been described for supported single-element metal clusters with spatial resolutions of about 10 nm. However, the detection of spurious characteristic x-rays away from catalyst particles produced images requiring several image processing steps.


Author(s):  
Y. Cheng ◽  
J. Liu ◽  
M.B. Stearns ◽  
D.G. Steams

The Rh/Si multilayer (ML) thin films are promising optical elements for soft x-rays since they have a calculated normal incidence reflectivity of ∼60% at a x-ray wavelength of ∼13 nm. However, a reflectivity of only 28% has been attained to date for ML fabricated by dc magnetron sputtering. In order to determine the cause of this degraded reflectivity the microstructure of this ML was examined on cross-sectional specimens with two high-resolution electron microscopy (HREM and HAADF) techniques.Cross-sectional specimens were made from an as-prepared ML sample and from the same ML annealed at 298 °C for 1 and 100 hours. The specimens were imaged using a JEM-4000EX TEM operating at 400 kV with a point-to-point resolution of better than 0.17 nm. The specimens were viewed along Si [110] projection of the substrate, with the (001) Si surface plane parallel to the beam direction.


2017 ◽  
Vol 112 (3) ◽  
pp. 346a
Author(s):  
Hannah Leopold ◽  
Megan Currie ◽  
Jacob Schwarz ◽  
Arnold J. Boersma ◽  
Erin D. Sheets ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document