Direct measurement of the inter-diffusion in quantum wells enhanced by group V intermixing for InP- based structures

Author(s):  
O. Hulko ◽  
D. A. Thompson ◽  
J. G. Simmons
1996 ◽  
Vol 450 ◽  
Author(s):  
Joseph Micallef ◽  
James L. Borg ◽  
Wai-Chee Shiu

ABSTRACTTheoretical results are presented showing how quantum well disordering affects the TE and TM absorption coefficient spectra of In0.53Ga0.47As/InP single quantum wells. An error function distribution is used to model the constituent atom composition after interdiffusion. Different interdiffusion rates on the group V and group III sublattices are considered resulting in a strained structure. With a suitable interdiffusion process the heavy hole and light hole ground state, excitonic transition energies merge and the absorption coefficient spectra near the fundamental absorption edge become polarization insensitive. The results also show that this polarization insensitivity can persist with the application of an electric field, which is of considerable interest in waveguide modulators.


1992 ◽  
Vol 281 ◽  
Author(s):  
F. G. Johnson ◽  
G. W. Wicks ◽  
R. E. Viturro ◽  
R. Laforce

ABSTRACTWe report on the first growth of GaAs/Ga0.5In0.5P heterostructures by conventional molecular beam epitaxy using solid-source valved crackers to supply both the arsenic and the phosphorus fluxes. By regulating the group V fluxes with the cracker needle valves, arsenide-phosphide heterostructures were successfully grown with virtually no group V intermixing between layers. For comparison, similar heterostructure samples were grown using only the mechanical shutters to switch between group V fluxes, and the resulting layers were severely intermixed. The amount of group V intermixing was shown to be independent of whether As2 or As4 fluxes were used to grow the layers. A GaAs/Ga0.5In0.5P multiple quantum well sample was also grown using the valved crackers. Photoluminescence peaks were clearly observed from 40 Å, 80 Å, and 300 Å GaAs quantum wells, but no luminescence was detected from a 20 Å well. An 80Å GaAs/ 80Å Ga0.5In0.5P superlattice was grown, and superlattice satellite peaks were observed in the X-ray rocking curves. The appearance of misfit dislocations suggests localized intermixing at the interfaces.


2006 ◽  
Vol 21 (6) ◽  
pp. 829-832 ◽  
Author(s):  
P L Gareso ◽  
M Buda ◽  
H H Tan ◽  
C Jagadish ◽  
S Ilyas ◽  
...  
Keyword(s):  
Group V ◽  

1995 ◽  
Vol 31 (4) ◽  
pp. 320-321 ◽  
Author(s):  
Y. Xu ◽  
A. Yariv ◽  
A. Shakouri ◽  
S. Dejewski ◽  
T. Krabach

1994 ◽  
Vol 340 ◽  
Author(s):  
V. Rossignol ◽  
A. H. Bensaoula ◽  
A. Freundlich ◽  
A. Bensaoula ◽  
G. Neu

ABSTRACTLow levels of arsenic contamination have been previously reported (∼0.01%) in CBE grown InP by different groups. The level of As incorporation in InP is usually enhanced when arsenide(InGaAs, InAsP) / InP heterostructures are grown.In this work, optimal growth conditions to minimize the non-intentional As contamination during the growth of these heterostructures are discussed. The red shift of band-edge excitons in the low temperature photoluminescence spectra as well as the analysis of high resolution X-ray diffraction patterns of InAsP/InP multi-quantum wells suggest the presence of As in InP barriers. This contamination is consistent with the ratio of As/P partial pressure (As residual in the chamber: 10-9-10-8 Torr) and the As/P incorporation rates. We have studied the influence of the growth temperature, the group-V/III flux ratio and the growth rate on the level of the As incorporation.


1989 ◽  
Vol 40 (5) ◽  
pp. 3028-3031 ◽  
Author(s):  
D. Y. Oberli ◽  
J. Shah ◽  
T. C. Damen ◽  
C. W. Tu ◽  
T. Y. Chang ◽  
...  

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