Cross-layer resilience using wearout aware design flow

Author(s):  
Bardia Zandian ◽  
Murali Annavaram
Keyword(s):  
Author(s):  
Mahfuzul Islam ◽  
Hidetoshi Onodera

AbstractCross-layer resiliency has become a critical deciding factor for any successful product. This chapter focuses on monitor circuits that are essential in realizing the cross-layer resiliency. The role of monitor circuits is to establish a bridge between the hardware and other layers by providing information about the devices and the operating environment in run-time. This chapter explores delay-based monitor circuits for design automation with the existing cell-based design methodology. The chapter discusses several design techniques to monitor parameters of threshold voltage, temperature, leakage current, critical delay, and aging. The chapter then demonstrates a reconfigurable architecture to monitor multiple parameters with small area footprint. Finally, an extraction methodology of physical parameters is discussed for model-hardware correlation. Utilizing the cell-based design flow, delay-based monitors can be placed inside the target digital circuit and thus a better correlation between monitor and target circuit behavior can be realized.


Author(s):  
Fabian Oboril ◽  
Mojtaba Ebrahimi ◽  
Saman Kiamehr ◽  
Mehdi B. Tahoori

2015 ◽  
Vol E98.B (7) ◽  
pp. 1333-1344
Author(s):  
Raymundo BUENROSTRO-MARISCAL ◽  
Maria COSIO-LEON ◽  
Juan-Ivan NIETO-HIPOLITO ◽  
Juan-Antonio GUERRERO-IBANEZ ◽  
Mabel VAZQUEZ-BRISENO ◽  
...  

2014 ◽  
Vol E97.B (4) ◽  
pp. 746-754 ◽  
Author(s):  
Wei FENG ◽  
Suili FENG ◽  
Yuehua DING ◽  
Yongzhong ZHANG

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