Standalone low-cost versatile FPGA-based fault generator for PROFIBUS DP

2021 ◽  
Author(s):  
Capron Jean-Marc ◽  
Troch Mathieu ◽  
De Schuyter Dimitri ◽  
Verhoeven Arne ◽  
Knockaert Jos ◽  
...  
Keyword(s):  
Low Cost ◽  
Profibus Dp

Low-cost PROFIBUS DP Slave Shield for embedded controllers

2016 ◽  
Author(s):  
Bram Vanseveren ◽  
Wesley Cottegnie ◽  
Jos Knockaert ◽  
Frederic Depuydt ◽  
Stijn Noppe ◽  
...  
Keyword(s):  
Low Cost ◽  
Profibus Dp

Design of an Arduino based low-cost error generator for PROFIBUS DP

2014 ◽  
Author(s):  
Philippe Saey ◽  
Hendrik Derre ◽  
Annemarie Kokosy ◽  
Ward Hauspie ◽  
Thomas De Landtsheer ◽  
...  
Keyword(s):  
Low Cost ◽  
Profibus Dp

The Time Siries Design of Profibus-DP Slave Based on FPGA

2012 ◽  
Vol 155-156 ◽  
pp. 1193-1197
Author(s):  
Zai Ping Chen ◽  
Zhen Xing Qiu
Keyword(s):  
Time Series ◽  
Transfer Rate ◽  
Low Cost ◽  
Simple Design ◽  
Industrial Control ◽  
Control Field ◽  
Time Performance ◽  
Series Design ◽  
Asic Chip ◽  
Profibus Dp

Profibus is widely used in industrial control field for the features of powerful communication real-time performance, high transfer rate, low cost and so on. FPGA and ASIC chip SPC3 are both used to design a Profibus-DP intelligent slave in this paper. And the time series design of FPGA cooperating with SPC3 in 80C32 working mode is detailed so that a new method of simple design of Profibus-DP intelligent slave is put forward.

Development of Automatic Control System for a Rolling Shear Line

2010 ◽  
Vol 145 ◽  
pp. 471-476
Author(s):  
Qian Lai Sun ◽  
Zhi Yi Sun ◽  
Xue Wen Yan ◽  
Hong Li
Keyword(s):  
Control System ◽  
Automatic Control ◽  
Automatic Control System ◽  
High Efficiency ◽  
Low Cost ◽  
Control Unit ◽  
Distributed Control System ◽  
Rolling Shear ◽  
Shear Line ◽  
Profibus Dp

An automatic control system is developed for a rolling shear line in this paper in order to overcome the weakness of the traditional control system. All of motion mechanisms are driven by alternating current motors. The S7-300 PLC is selected as the control unit. And the PROFIBUS-DP field bus is employed to structure a distributed control system. Automatic cutting to length is realized. The rolling shear line has some merits such as high efficiency and precision, low cost and energy consummation ensured by the control system. The control system is reliable and flexible.

Decomposition of the metastable beta titanium alloy Ti-15-3

1983 ◽  
Vol 41 ◽  
pp. 264-265
Author(s):  
Y. L. Chen ◽  
S. Fujlshiro
Keyword(s):  
Low Cost ◽  
High Strength ◽  
Alpha Phase ◽  
Thick Sheet ◽  
Omega Phase ◽  
Beta Titanium Alloy ◽  
Beta Titanium ◽  
Beta Matrix ◽  
Metastable Beta ◽  
Very High

Metastable beta titanium alloys have been known to have numerous advantages such as cold formability, high strength, good fracture resistance, deep hardenability, and cost effectiveness. Very high strength is obtainable by precipitation of the hexagonal alpha phase in a bcc beta matrix in these alloys. Precipitation hardening in the metastable beta alloys may also result from the formation of transition phases such as omega phase. Ti-15-3 (Ti-15V- 3Cr-3Al-3Sn) has been developed recently by TIMET and USAF for low cost sheet metal applications. The purpose of the present study was to examine the aging characteristics in this alloy.The composition of the as-received material is: 14.7 V, 3.14 Cr, 3.05 Al, 2.26 Sn, and 0.145 Fe. The beta transus temperature as determined by optical metallographic method was about 770°C. Specimen coupons were prepared from a mill-annealed 1.2 mm thick sheet, and solution treated at 827°C for 2 hr in argon, then water quenched. Aging was also done in argon at temperatures ranging from 316 to 616°C for various times.

Chromic Acid Etching of Polyethylene

1973 ◽  
Vol 31 ◽  
pp. 72-73
Author(s):  
J. D. Muzzy ◽  
R. D. Hester ◽  
J. L. Hubbard
Keyword(s):  
Chromic Acid ◽  
Low Cost ◽  
Acid Etching ◽  
Crystalline Morphology ◽  
Bulk Specimen ◽  
Morphological Studies ◽  
Perfect Form ◽  
Molecular Length ◽  
Lamellar Texture ◽  
Cost Studies

Polyethylene is one of the most important plastics produced today because of its good physical properties, ease of fabrication and low cost. Studies to improve the properties of polyethylene are leading to an understanding of its crystalline morphology. Polyethylene crystallized by evaporation from dilute solutions consists of thin crystals called lamellae. The polyethylene molecules are parallel to the thickness of the lamellae and are folded since the thickness of the lamellae is much less than the molecular length. This lamellar texture persists in less perfect form in polyethylene crystallized from the melt.Morphological studies of melt crystallized polyethylene have been limited due to the difficulty of isolating the microstructure from the bulk specimen without destroying or deforming it.

Glass Knife Geometry as Seen by the SEM

1971 ◽  
Vol 29 ◽  
pp. 454-455
Author(s):  
J. Temple Black
Keyword(s):  
Low Cost ◽  
Amorphous Material ◽  
Stress Concentrations ◽  
Basic Tool ◽  
Tool Materials ◽  
Optical Inspection ◽  
Surface Flaws ◽  
Slip Planes ◽  
Glass Knife ◽  
Diamond Knife

In ultramicrotomy, the two basic tool materials are glass and diamond. Glass because of its low cost and ease of manufacture of the knife itself is still widely used despite the superiority of diamond knives in many applications. Both kinds of knives produce plastic deformation in the microtomed section due to the nature of the cutting process and microscopic chips in the edge of the knife. Because glass has no well defined slip planes in its structure (it's an amorphous material), it is very strong and essentially never fails in compression. However, surface flaws produce stress concentrations which reduce the strength of glass to 10,000 to 20,000 psi from its theoretical or flaw free values of 1 to 2 million psi. While the microchips in the edge of the glass or diamond knife are generally too small to be observed in the SEM, the second common type of defect can be identified. This is the striations (also termed the check marks or feathers) which are always present over the entire edge of a glass knife regardless of whether or not they are visable under optical inspection. These steps in the cutting edge can be observed in the SEM by proper preparation of carefully broken knives and orientation of the knife, with respect to the scanning beam.

Spectraplot: A PC-based spectrum translation and display program

1988 ◽  
Vol 46 ◽  
pp. 918-919
Author(s):  
H. O. Colijn
Keyword(s):  
Low Cost ◽  
Transfer Program ◽  
File Transfer ◽  
Transfer Data ◽  
Error Checking ◽  
Data Files ◽  
The University

Many labs today wish to transfer data between their EDS systems and their existing PCs and minicomputers. Our lab has implemented SpectraPlot, a low- cost PC-based system to allow offline examination and plotting of spectra. We adopted this system in order to make more efficient use of our microscopes and EDS consoles, to provide hardcopy output for an older EDS system, and to allow students to access their data after leaving the university.As shown in Fig. 1, we have three EDS systems (one of which is located in another building) which can store data on 8 inch RT-11 floppy disks. We transfer data from these systems to a DEC MINC computer using “SneakerNet”, which consists of putting on a pair of sneakers and running down the hall. We then use the Hermit file transfer program to download the data files with error checking from the MINC to the PC.

Transmission Electron Microscopy of oriented Co84Cr14Ta2 thin films for longitudinal magnetic recording

1991 ◽  
Vol 49 ◽  
pp. 756-757
Author(s):  
T. P. Nolan
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Low Cost ◽  
Low Noise ◽  
Information Storage ◽  
High Coercivity ◽  
Magnetic Alloy ◽  
Magnetic Media ◽  
Transmission Electron

Thin film magnetic media are being used as low cost, high density forms of information storage. The development of this technology requires the study, at the sub-micron level, of morphological, crystallographic, and magnetic properties, throughout the depth of the deposited films. As the microstructure becomes increasingly fine, widi grain sizes approaching 100Å, the unique characterization capabilities of transmission electron microscopy (TEM) have become indispensable to the analysis of such thin film magnetic media.Films were deposited at 225°C, on two NiP plated Al substrates, one polished, and one circumferentially textured with a mean roughness of 55Å. Three layers, a 750Å chromium underlayer, a 600Å layer of magnetic alloy of composition Co84Cr14Ta2, and a 300Å amorphous carbon overcoat were then sputter deposited using a dc magnetron system at a power of 1kW, in a chamber evacuated below 10-6 torr and filled to 12μm Ar pressure. The textured medium is presently used in industry owing to its high coercivity, Hc, and relatively low noise. One important feature is that the coercivity in the circumferential read/write direction is significandy higher than that in the radial direction.

Influence of MBE Growth Conditions on Dislocation Densities of GaAs/Ge Epilayers Grown on Silicon Substrates

1985 ◽  
Vol 43 ◽  
pp. 364-365
Author(s):  
K.M. Hones ◽  
P. Sheldon ◽  
B.G. Yacobi ◽  
A. Mason
Keyword(s):  
High Efficiency ◽  
Lattice Mismatch ◽  
Low Cost ◽  
Growth Conditions ◽  
Nonradiative Recombination ◽  
Device Structure ◽  
Si Substrates ◽  
Transmission Electron ◽  
Dislocation Densities ◽  
Dislocation Type

There is increasing interest in growing epitaxial GaAs on Si substrates. Such a device structure would allow low-cost substrates to be used for high-efficiency cascade- junction solar cells. However, high-defect densities may result from the large lattice mismatch (∼4%) between the GaAs epilayer and the silicon substrate. These defects can act as nonradiative recombination centers that can degrade the optical and electrical properties of the epitaxially grown GaAs. For this reason, it is important to optimize epilayer growth conditions in order to minimize resulting dislocation densities. The purpose of this paper is to provide an indication of the quality of the epitaxially grown GaAs layers by using transmission electron microscopy (TEM) to examine dislocation type and density as a function of various growth conditions. In this study an intermediate Ge layer was used to avoid nucleation difficulties observed for GaAs growth directly on Si substrates. GaAs/Ge epilayers were grown by molecular beam epitaxy (MBE) on Si substrates in a manner similar to that described previously.

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