An Analytical Model and Measurement on the InAlAs/InGaAs High-Electron-Mobility Transistor with Oxidized InAlAs Gate
2007 ◽
Vol 7
(2)
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pp. 120-131
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1998 ◽
Vol 31
(2)
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pp. 159-164
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2006 ◽
Vol 45
(No. 35)
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pp. L932-L934
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2004 ◽
Vol 43
(12)
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pp. 8019-8023
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