Optimization of Fault-Tolerant Fabric-Cutting Table Planning in a Just-In-Time Apparel Manufacturing Environment

2006 ◽  
Author(s):  
Pik-yin Mok ◽  
Wai-keung Wong ◽  
Chun-kit Kowng
Keyword(s):  
Fault Tolerant ◽  
Just In Time ◽  
Manufacturing Environment ◽  
Apparel Manufacturing

scholarly journals The Relevancy of Just–In–Time (JIT) Concept in Government Purchasing

2012 ◽  
Author(s):  
Khin Chung Chai ◽  
Nooh Abu Bakar
Keyword(s):  
Supply Management ◽  
Just In Time ◽  
Manufacturing Environment ◽  
Considerable Success ◽  
Public Sectors ◽  
A Current

Aplikasi konsep "Just–in–Time" (JIT) telah mencapai kejayaan yang ketara dalam persekitaran pembuatan. Kertas kerja ini memberi penjelasan yang terperinci terhadap konsep JIT serta menerangkan prasyarat dalam pelaksanaannya di sektor awam atau swasta. Walaupun kekuatan konsep ini tidak dipertikaikan, tetapi terdapat kajian menunjukkan bahawa ia tidak sesuai digunapakai untuk perolehan kerajaan secara menyeluruh. Namun demikian, nilai–nilai konsep JIT dalam konteks pengurusan pembekalan boleh dan patut diterokai. Just–in–Time (JIT) concept has been applied with considerable success in manufacturing environment. This paper provides insights of JIT concept and the pre–requisites for successful application of JIT in either private or public sectors. Although JIT concept has many advantages, a current study suggested that its application couldn´t be applied in total to Govenment purchasing environment. Nevertheless, the essence of JIT concept in the context of supply management can and should be exploited.

Supply planning models for a remanufacturer under just-in-time manufacturing environment with reverse logistics

2014 ◽  
Vol 240 (2) ◽  
pp. 533-581 ◽  
Author(s):  
Kyung Sung Jung ◽  
Milind Dawande ◽  
H. Neil Geismar ◽  
V. Daniel R. Guide ◽  
Chelliah Sriskandarajah
Keyword(s):  
Reverse Logistics ◽  
Just In Time ◽  
Manufacturing Environment ◽  
Planning Models ◽  
Supply Planning

Supply Planning Models for a Remanufacturer Under Just-in-Time Manufacturing Environment with Reverse Logistics

2014 ◽  
Author(s):  
Kyung Sung Jung ◽  
Milind Dawande ◽  
Neil Geismar ◽  
V. Daniel R. Guide ◽  
Chelliah Sriskandarajah
Keyword(s):  
Reverse Logistics ◽  
Just In Time ◽  
Manufacturing Environment ◽  
Planning Models ◽  
Supply Planning

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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