The application of FMEA technology in the unstable failure analysis

Author(s):  
Guanghua Yuan ◽  
Gaoming Shi ◽  
Nilu Hou ◽  
Xianjun Kuang
2015 ◽  
Vol 56 ◽  
pp. 484-500 ◽  
Author(s):  
Takashi Wakai ◽  
Hideo Machida ◽  
Shinji Yoshida ◽  
Seiji Yanagihara ◽  
Ryosuke Suzuki ◽  
...  

Author(s):  
Takashi Wakai ◽  
Hideo Machida ◽  
Manabu Arakawa ◽  
Koichi Kikuchi

A simplified J-integral evaluation method applicable to unstable failure analysis in Leak Before Break (LBB) assessment of Sodium-cooled Fast Reactor (SFR) in Japan was proposed. Mod.9Cr-1Mo steel is supposed to be a candidate material for the coolant systems of SFR in Japan. This steel has relatively high yield strength and poor fracture toughness comparing to those of conventional austenitic stainless steels. In addition, SFR pipe has small thickness and large diameter. Furthermore, in SFR, primary stresses are insignificant and displacement controlled secondary stresses are predominant. Therefore, the load balance in such piping system changes by crack extension and R6 (2-parameter) method (hereinafter “2-parameter method”) [1] using J-integral is applicable to unstable failure analysis for the pipes under such loading conditions. As a J-integral evaluation method for circumferential through-wall crack in a cylinder, EPRI has proposed a fully plastic solution method. However, the geometry of SFR pipe and material characteristics of Mod.9Cr-1Mo steel exceed the applicable range of EPRI’s method. Therefore, a series of elastic, elasto-plastic and plastic finite element analyses (FEA) were performed for a pipe with a circumferential through-wall crack to propose a J-integral evaluation method applicable to such loading conditions. J-integrals obtained from the FEA were resolved into elastic, local plastic and fully plastic components. Each component was expressed as a function of analytical parameter, such as pipe geometries, crack size, material characteristics and so on. As a result, a simplified J-integral evaluation method was proposed. The method enables to conduct 2-parameter method using J-integral without any fracture mechanics knowledge.


Author(s):  
John R. Devaney

Occasionally in history, an event may occur which has a profound influence on a technology. Such an event occurred when the scanning electron microscope became commercially available to industry in the mid 60's. Semiconductors were being increasingly used in high-reliability space and military applications both because of their small volume but, also, because of their inherent reliability. However, they did fail, both early in life and sometimes in middle or old age. Why they failed and how to prevent failure or prolong “useful life” was a worry which resulted in a blossoming of sophisticated failure analysis laboratories across the country. By 1966, the ability to build small structure integrated circuits was forging well ahead of techniques available to dissect and analyze these same failures. The arrival of the scanning electron microscope gave these analysts a new insight into failure mechanisms.


Author(s):  
Evelyn R. Ackerman ◽  
Gary D. Burnett

Advancements in state of the art high density Head/Disk retrieval systems has increased the demand for sophisticated failure analysis methods. From 1968 to 1974 the emphasis was on the number of tracks per inch. (TPI) ranging from 100 to 400 as summarized in Table 1. This emphasis shifted with the increase in densities to include the number of bits per inch (BPI). A bit is formed by magnetizing the Fe203 particles of the media in one direction and allowing magnetic heads to recognize specific data patterns. From 1977 to 1986 the tracks per inch increased from 470 to 1400 corresponding to an increase from 6300 to 10,800 bits per inch respectively. Due to the reduction in the bit and track sizes, build and operating environments of systems have become critical factors in media reliability.Using the Ferrofluid pattern developing technique, the scanning electron microscope can be a valuable diagnostic tool in the examination of failure sites on disks.


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