Negative Bias Temperature Instability in 4H-SiC MOSFETs Investigated by On-the-fly Methods
2019 ◽
Vol 11
(4)
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pp. 04018-1-04018-6
2008 ◽
Vol 55
(7)
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pp. 1630-1638
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2008 ◽
Vol 8
(1)
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pp. 79-97
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