Time dependent deformation behavior of interfacial intermetallic compounds in electronic solder joints

Author(s):  
Jenn-Ming Song ◽  
Chien-Wei Su ◽  
Yi-Shao Lai ◽  
Ying-Ta Chiu
2010 ◽  
Vol 25 (4) ◽  
pp. 629-632 ◽  
Author(s):  
Jenn-Ming Song ◽  
Chien-Wei Su ◽  
Yi-Shao Lai ◽  
Ying-Ta Chiu

Using nanoindentation, this study develops the criteria to evaluate the creep performance of the intermetallic compounds (IMCs) formed at the interface of microelectronic solder joints. Regardless of crystal structure and melting point, the creep stress exponent (X), one of the parameters determining creep resistance, is in good agreement with tendencies of the work-hardening exponent (n) and also the ratio of yield stress (Y) to Young's modulus (E), which reveals the ability against plastic deformation.


1998 ◽  
Vol 37 (Part 1, No. 11) ◽  
pp. 6102-6106 ◽  
Author(s):  
Daisuke Tanaka ◽  
Shigeo Ohshio ◽  
Hidetoshi Saitoh

Sign in / Sign up

Export Citation Format

Share Document