Direct BSIM3v3 parameter extraction for hot-carrier reliability simulation of N-channel LDD MOSFETs

2002 ◽  
Author(s):  
S. Minehane ◽  
S. Healy ◽  
P. O'Sullivan ◽  
K. McCarthy ◽  
A. Mathewson ◽  
...  
Keyword(s):  
Parameter Extraction ◽  
Hot Carrier

Parameter extraction method for inhomogeneous MOSFETs locally damaged by hot carrier injection

1988 ◽  
Vol 31 (11) ◽  
pp. 1573-1581 ◽  
Author(s):  
Hisham S. Haddara ◽  
Sorin Cristoloveanu
Keyword(s):  
Extraction Method ◽  
Parameter Extraction ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection

Modelling and Characterization of Submicron P-Channel MOSFET's Locally Degraded by Hot Carrier Injection

1991 ◽  
Vol 225 ◽  
Author(s):  
A. Hassein-Bey ◽  
S. Cristoloveanu
Keyword(s):  
Practical Method ◽  
Parameter Extraction ◽  
Carrier Injection ◽  
Hot Carrier ◽  
Hot Carrier Injection ◽  
Strong Inversion ◽  
Before And After ◽  
Basic Characteristics ◽  
Channel Region

ABSTRACTThe influence of the localized defective channel region formed by hot carrier injection on the basic characteristics of P-channel transistors is systematically investigated and modeled. A practical method of parameter extraction in stressed P-MOSFET's is proposed. It is based on the comparison of Ids(Vg) characteristics before and after stress in weak and strong inversion.

The application of a direct parameter extraction strategy to hot-carrier reliability simulation of n-channel LDD MOSFETs

2002 ◽  
Author(s):  
S. Minehane ◽  
A. Meehan ◽  
P. O'Sullivan ◽  
A. Mathewson ◽  
B. Mason
Keyword(s):  
Parameter Extraction ◽  
Hot Carrier

Direct parameter extraction for hot-carrier reliability simulation

1997 ◽  
Vol 37 (10-11) ◽  
pp. 1437-1440 ◽  
Author(s):  
S. Minehane ◽  
S. Healy ◽  
P. O'Sullivan ◽  
K. McCarthy ◽  
A. Mathewson ◽  
...  
Keyword(s):  
Parameter Extraction ◽  
Hot Carrier

MOSFET modeling and parameter extraction for low temperature analog circuit design

2002 ◽  
Vol 12 (3) ◽  
pp. 51-56 ◽  
Author(s):  
P. Martin ◽  
M. Bucher ◽  
C. Enz
Keyword(s):  
Low Temperature ◽  
Circuit Design ◽  
Analog Circuit ◽  
Parameter Extraction ◽  
Analog Circuit Design

PERIODIC OSCILLATIONS AND TURBULENCE OF HOT-CARRIER PLASMA AT 4.2 K IN n-GaAs

1981 ◽  
Vol 42 (C7) ◽  
pp. C7-51-C7-56
Author(s):  
K. Aoki ◽  
T. Kobayashi ◽  
K. Yamamoto
Keyword(s):  
Periodic Oscillations ◽  
Hot Carrier

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes
Sign in / Sign up

Export Citation Format

Share Document