Influence of high-voltage gate-oxide pulses on the BTI behavior of SiC MOSFETs

Author(s):  
S. Maas ◽  
H. Reisinger ◽  
T. Aichinger ◽  
G. Rescher
Keyword(s):  
Electronics ◽  
2020 ◽  
Vol 9 (10) ◽  
pp. 1729
Author(s):  
Kunhee Cho

An ultra-low quiescent current under-voltage lockout (UVLO) circuit for a high-voltage gate driver integrated circuit (HVIC) is described for application in portable devices. The UVLO circuit consumes the static current in the high-side circuitry and the resistive divider used to detect the supply-voltage was the major consumer of power in the circuit. Hence, a supply-voltage sensor based on a diode-connected metal–oxide–semiconductor field-effect transistor (MOSFET) with a voltage limiter design is proposed to ensure low power consumption. Unlike the conventional UVLO design, where a resistive divider is used, the proposed structure dissipates the negligible current at a low supply-voltage and significantly reduces the static current at the nominal and high supply-voltage. The high-side quiescent current using the proposed design and the conventional designs at various supply-voltage levels are analyzed. In the proposed structure, the size of the voltage sensor is considerably smaller when compared with those in conventional designs.


2007 ◽  
Vol 47 (4-5) ◽  
pp. 615-618 ◽  
Author(s):  
Yosef Raskin ◽  
Asaad Salameh ◽  
David Betel ◽  
Yakov Roizin

2019 ◽  
Vol 104 (1) ◽  
pp. 27-36
Author(s):  
Yangyang Lu ◽  
Jing Zhu ◽  
Kongsheng Hu ◽  
Siyuan Yu ◽  
Ding Yan ◽  
...  

2008 ◽  
Author(s):  
Min Gon Lee ◽  
Chung Kyung Jung ◽  
Sang Wook Ryu ◽  
Kang Hyun Lee ◽  
Jae Won Han

Sign in / Sign up

Export Citation Format

Share Document