Characterizing damage to thin oxides induced during programming floating trap non-volatile semiconductor memory devices
1976 ◽
Vol 64
(7)
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pp. 1039-1059
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2005 ◽
Vol 44
(9A)
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pp. 6380-6384
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Keyword(s):
2008 ◽
Vol 47
(4)
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pp. 2680-2683
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2015 ◽
Vol 33
(1)
◽
pp. 01A113
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