SPICE parameters extraction methods of MOS transistors under ionizing irradiation action

2012 ◽  
Author(s):  
V.I. Rusanovschi ◽  
A.I. Avram ◽  
M. Rusanovschi
Keyword(s):  
Extraction Methods ◽  
Mos Transistors ◽  
Ionizing Irradiation ◽  
Parameters Extraction

MOS Transistors on SOI Substrate: On-Wafer Measurement for Small-Signal Parameters Extraction Procedure

1999 ◽  
Author(s):  
A. Bracale ◽  
N. Fel ◽  
V. Ferlet-Cavrois ◽  
D. Pasquet ◽  
J.L. Gautier ◽  
...  
Keyword(s):  
Extraction Procedure ◽  
Small Signal ◽  
Mos Transistors ◽  
Signal Parameters ◽  
Parameters Extraction

Small Signal Parameters Extraction for Silicon MOS Transistors

2000 ◽  
Author(s):  
A. Bracale ◽  
D. Pasquet ◽  
J.L. Gautier ◽  
V. Ferlet ◽  
N. Fel ◽  
...  
Keyword(s):  
Small Signal ◽  
Mos Transistors ◽  
Signal Parameters ◽  
Parameters Extraction

Research on the Summarization of the Gear Parameters

2013 ◽  
Vol 765-767 ◽  
pp. 2074-2077
Author(s):  
Chun Xiang Wang ◽  
Hong Min Shi
Keyword(s):  
Reverse Engineering ◽  
Measurement Technique ◽  
Point Cloud ◽  
Parameter Extraction ◽  
Extraction Methods ◽  
Measurement Technology ◽  
Image Measurement ◽  
Parameters Extraction ◽  
Research Situation ◽  
At Home

In this paper, combining with research situation at home and abroad,the gear parameters extraction methods were compared,including point cloud extraction in reverse engineering, image measurement technology and traditional measurement technique, etc. Analyzes the various technical method,At last,gear parameter extraction of the prospects for development are put forward.

ANALYSIS OF HOT CARRIER DEGRADATION IN AC STRESSED N-CHANNEL MOS TRANSISTORS USING THE CHARGE PUMPING TECHNIQUE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-651-C4-655 ◽  
Author(s):  
R. BELLENS ◽  
P. HEREMANS ◽  
G. GROESENEKEN ◽  
H. E. MAES
Keyword(s):  
Mos Transistors ◽  
Charge Pumping ◽  
Hot Carrier ◽  
Hot Carrier Degradation
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