Long-Wavelength GaInNAs Vertical-Cavity Surface-Emitting Laser With Buried Tunnel Junction

2009 ◽  
Vol 15 (3) ◽  
pp. 838-843 ◽  
Author(s):  
Yutaka Onishi ◽  
Nobuhiro Saga ◽  
Kenji Koyama ◽  
Hideyuki Doi ◽  
Takashi Ishizuka ◽  
...  
2000 ◽  
Vol 39 (Part 1, No. 7A) ◽  
pp. 3997-4001 ◽  
Author(s):  
Shigeaki Sekiguchi ◽  
Tomoyuki Miyamoto ◽  
Tadayoshi Kimura ◽  
Gen Okazaki ◽  
Fumio Koyama ◽  
...  

2000 ◽  
Vol 36 (13) ◽  
pp. 1124 ◽  
Author(s):  
M. Ortsiefer ◽  
R. Shau ◽  
M. Zigldrum ◽  
G. Böhm ◽  
F. Köhler ◽  
...  

1998 ◽  
Vol 72 (2) ◽  
pp. 135-137 ◽  
Author(s):  
H. Gebretsadik ◽  
K. Kamath ◽  
W.-D. Zhou ◽  
P. Bhattacharya ◽  
C. Caneau ◽  
...  

Crystals ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 187 ◽  
Author(s):  
Chih-Chiang Shen ◽  
Yun-Ting Lu ◽  
Yen-Wei Yeh ◽  
Cheng-Yuan Chen ◽  
Yu-Tzu Chen ◽  
...  

In this study, we theoretically designed and experimentally fabricated an InGaN vertical-cavity surface-emitting laser (VCSEL) with a tunnel junction (TJ) structure. From numerical simulation results, the optical loss of the device can be reduced by a TJ structure. Additionally, the leakage current of the VCSEL with TJ structure was much smaller than that of the VCSEL with an Indium-Tin-Oxide (ITO) layer. We have been demonstrated that laser output performance is improved by using the TJ structure when compared to the typical VCSEL structure of the ITO layer. The output power obtained at 2.1 mW was enhanced by a factor of 3.5 by the successful reduction of threshold current density (Jth) from 12 to 8.5 kA/cm2, and the enlarged slope efficiency was due to less absorption in VCSEL with a TJ structure. Finally, the samples passed the high temperature (70 °C) and high operation current (1.5 × Jth) test for over 500 h.


2001 ◽  
Vol 37 (24) ◽  
pp. 1459 ◽  
Author(s):  
Yiping He ◽  
Qiang Zhang ◽  
A.V. Nurmikko ◽  
J. Slaughter ◽  
R.W. Dave ◽  
...  

2001 ◽  
Vol 40 (Part 1, No. 10) ◽  
pp. 5909-5913 ◽  
Author(s):  
Shigeaki Sekiguchi ◽  
Tadayoshi Kimura ◽  
Gen Okazaki ◽  
Tomoyuki Miyamoto ◽  
Fumio Koyama ◽  
...  

1996 ◽  
Vol 421 ◽  
Author(s):  
D.I. Babic ◽  
V. Jayaraman ◽  
N. M. Margalit ◽  
K. Streubel ◽  
M.E. Heimbuch ◽  
...  

AbstractLong-wavelength (1300/1550 nm) vertical-cavity surface-emitting lasers (VCSELs) have been much more difficult to realize than VCSELs at shorter wavelengths such as 850/980 nm. The primary reason for this has been the low refractive index difference and reflectivity associated with lattice-matched InP/InGaAsP mirrors. A solution to this problem is to “wafer-fuse” high-reflectivity GaAs/AlGaAs mirrors to InP/InGaAsP active regions. This process has led to the first room-temperature continuous-wave (CW) 1.54 μm VCSELs. In this paper, we discuss two device geometries which employ wafer-fused mirrors, both of which lead to CW operation. We also discuss fabrication of WDM arrays using long-wavelength VCSELs.


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