Modeling the partition of noise from the gate-tunneling current in MOSFETs
2005 ◽
Vol 26
(8)
◽
pp. 550-552
◽
2003 ◽
Vol 50
(12)
◽
pp. 2579-2581
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2018 ◽
Vol 29
(18)
◽
pp. 15496-15501
Keyword(s):
Keyword(s):
2007 ◽
Vol 54
(10)
◽
pp. 2614-2622
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2017 ◽
Vol 12
(7)
◽
pp. 724-730