System On Microheater for On-Chip Annealing of Defects Generated by Hot-Carrier Injection, Bias Temperature Instability, and Ionizing Radiation
2016 ◽
Vol 37
(12)
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pp. 1543-1546
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2016 ◽
Vol 24
(8)
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pp. 2712-2725
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2015 ◽
Vol 55
(9-10)
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pp. 2113-2118
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2008 ◽
Vol 21
(8)
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pp. 687-694
2008 ◽
Vol 41
(2)
◽
pp. 023001
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