Investigation on Electrostatic Discharge Robustness of Gate-All-Around Silicon Nanowire Transistors Combined With Thermal Analysis
2017 ◽
Vol 38
(12)
◽
pp. 1653-1656
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2015 ◽
Vol 7
(18)
◽
pp. 9866-9878
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Keyword(s):
2021 ◽
Vol 21
(8)
◽
pp. 4330-4335
Keyword(s):