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Optimization of Probe Parameters of Atomic Force Microscope Cantilever
2019 IEEE XVth International Conference on the Perspective Technologies and Methods in MEMS Design (MEMSTECH)
◽
10.1109/memstech.2019.8817389
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2019
◽
Cited By ~ 1
Author(s):
Petro Kosobutskyy
◽
Nazariy Jaworski
◽
Ihor Farmaha
◽
Mariia Kuzmynykh
Keyword(s):
Atomic Force Microscope
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Related Documents
Cited By
References
Influence of atomic force microscope cantilever tilt and induced torque on force measurements
Journal of Applied Physics
◽
10.1063/1.2885734
◽
2008
◽
Vol 103
(6)
◽
pp. 064513
◽
Cited By ~ 35
Author(s):
Scott A. Edwards
◽
William A. Ducker
◽
John E. Sader
Keyword(s):
Atomic Force Microscope
◽
Force Measurements
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Atomic force microscope cantilever based microcoordinate measuring probe for true three-dimensional measurements of microstructures
Applied Physics Letters
◽
10.1063/1.2786881
◽
2007
◽
Vol 91
(12)
◽
pp. 121912
◽
Cited By ~ 15
Author(s):
Gaoliang Dai
◽
Helmut Wolff
◽
Hans-Ulrich Danzebrink
Keyword(s):
Atomic Force Microscope
◽
Three Dimensional
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Measuring Probe
◽
Dimensional Measurements
◽
Force Microscope Cantilever
Download Full-text
Improved Nanotopography Sensing via Temperature Control of a Heated Atomic Force Microscope Cantilever
IEEE Sensors Journal
◽
10.1109/jsen.2011.2157121
◽
2011
◽
Vol 11
(11)
◽
pp. 2664-2670
◽
Cited By ~ 12
Author(s):
Suhas Somnath
◽
Elise A. Corbin
◽
William P. King
Keyword(s):
Atomic Force Microscope
◽
Temperature Control
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Eigenfrequencies of a rectangular atomic force microscope cantilever in a medium
Journal of Applied Physics
◽
10.1063/1.365379
◽
1997
◽
Vol 81
(12)
◽
pp. 7709-7714
◽
Cited By ~ 74
Author(s):
Franz-Josef Elmer
◽
Markus Dreier
Keyword(s):
Atomic Force Microscope
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Next generation of heated atomic force microscope cantilever for nanolithography: modelling, simulation, and nanofabrication
Novel Patterning Technologies for Semiconductors, MEMS/NEMS, and MOEMS 2019
◽
10.1117/12.2514686
◽
2019
◽
Author(s):
Mohammadreza Soleymaniha
◽
Jonathan R. Felts
Keyword(s):
Atomic Force Microscope
◽
Next Generation
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Modelling Simulation
◽
Force Microscope Cantilever
Download Full-text
Dynamic analysis of flexural vibration mode of an atomic force microscope cantilever with a sidewall probe in liquid
Microscopy Research and Technique
◽
10.1002/jemt.23636
◽
2020
◽
Author(s):
Amir F. Payam
◽
Nguyen Duy Vy
Keyword(s):
Dynamic Analysis
◽
Atomic Force Microscope
◽
Vibration Mode
◽
Flexural Vibration
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Small mass measurements for tuning fork-based atomic force microscope cantilever spring constant calibration
MEMS and Nanotechnology, Volume 2 - Conference Proceedings of the Society for Experimental Mechanics Series
◽
10.1007/978-1-4419-8825-6_8
◽
2011
◽
pp. 49-56
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Cited By ~ 3
Author(s):
Gordon A. Shaw
◽
Jon R. Pratt
◽
Zeina J. Jabbour
Keyword(s):
Atomic Force Microscope
◽
Tuning Fork
◽
Small Mass
◽
Spring Constant
◽
Mass Measurements
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods
Measurement Science and Technology
◽
10.1088/0957-0233/20/12/125501
◽
2009
◽
Vol 20
(12)
◽
pp. 125501
◽
Cited By ~ 26
Author(s):
Charles A Clifford
◽
Martin P Seah
Keyword(s):
Uncertainty Analysis
◽
Atomic Force Microscope
◽
Experimental Methods
◽
Spring Constant
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Improved Methods
◽
Force Microscope Cantilever
Download Full-text
Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube
Journal of Applied Physics
◽
10.1063/1.3626811
◽
2011
◽
Vol 110
(5)
◽
pp. 054305
◽
Cited By ~ 7
Author(s):
Tarek K. Ghanem
◽
Ellen D. Williams
◽
Michael S. Fuhrer
Keyword(s):
Carbon Nanotube
◽
Atomic Force Microscope
◽
Electrical Contact
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
Sensitivity Analysis of a Cracked Atomic Force Microscope Cantilever
Japanese Journal of Applied Physics
◽
10.7567/jjap.51.035202
◽
2012
◽
Vol 51
(3R)
◽
pp. 035202
◽
Cited By ~ 2
Author(s):
Haw-Long Lee
◽
Win-Jin Chang
Keyword(s):
Sensitivity Analysis
◽
Atomic Force Microscope
◽
Atomic Force Microscope Cantilever
◽
Atomic Force
◽
Force Microscope Cantilever
Download Full-text
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