Metallic Top Contacts to Self-Assembled Monolayers of Aliphatic Phosphonic Acids on Titanium Nitride

Author(s):  
Julian M. Dlugosch ◽  
Deepthi Devendra ◽  
Domenikos Chryssikos ◽  
Sabrina Artmeier ◽  
Maximilian Speckbacher ◽  
...  
Langmuir ◽  
2009 ◽  
Vol 25 (18) ◽  
pp. 10746-10753 ◽  
Author(s):  
Getachew Tizazu ◽  
Ali M. Adawi ◽  
Graham J. Leggett ◽  
David G. Lidzey

2020 ◽  
Vol 49 (11) ◽  
pp. 1302-1305
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Toshiki Higashino ◽  
Kazunori Kuribara ◽  
Naoya Toda ◽  
Sei Uemura ◽  
Hiroaki Tachibana ◽  
...  

2014 ◽  
Vol 24 (23) ◽  
pp. 3593-3603 ◽  
Author(s):  
Hong Li ◽  
Erin L. Ratcliff ◽  
Ajaya K. Sigdel ◽  
Anthony J. Giordano ◽  
Seth R. Marder ◽  
...  

Soft Matter ◽  
2009 ◽  
Vol 5 (4) ◽  
pp. 750 ◽  
Author(s):  
Siwar Trabelsi ◽  
Shishan Zhang ◽  
Zhongcheng Zhang ◽  
T. Randall Lee ◽  
Daniel K. Schwartz

Langmuir ◽  
1999 ◽  
Vol 15 (21) ◽  
pp. 7111-7115 ◽  
Author(s):  
C. Yee ◽  
G. Kataby ◽  
A. Ulman ◽  
T. Prozorov ◽  
H. White ◽  
...  

Materials ◽  
2020 ◽  
Vol 13 (22) ◽  
pp. 5137
Author(s):  
Michal Cichomski ◽  
Milena Prowizor ◽  
Dorota Anna Kowalczyk ◽  
Andrzej Sikora ◽  
Damian Batory ◽  
...  

This study compared the tribological properties in nano- and millinewton load ranges of Ti‑6Al-4V surfaces that were modified using self-assembled monolayers (SAMs) of carboxylic and phosphonic acids. The effectiveness of the creation of SAMs with the use of the liquid phase deposition (LPD) technique was monitored by the contact angle measurement, the surface free energy (SFE) calculation, X-ray photoelectron spectroscopy (XPS), and Fourier-transform infrared spectroscopy (FTIR) measurements. The obtained results indicated that more stable and well-ordered layers, which were characterized by the lowest values of the coefficient of friction, adhesion, and wear rate, were obtained using phosphonic acid as a surface modifier. Based on the obtained results, it was found that the Ti-6Al-4V alloy modified by phosphonic acid would be the most advantageous for practical applications, especially in micro- and nanoelectromechanical systems (MEMS/NEMS).


1998 ◽  
Vol 95 (6) ◽  
pp. 1339-1342 ◽  
Author(s):  
R. Michalitsch ◽  
A. El Kassmi ◽  
P. Lang ◽  
A. Yassar ◽  
F. Garnier

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