30 Gbit/s 1.7 pJ/bit common-cathode tunable 850-nm-VCSEL driver in 28 nm digital CMOS

2017 ◽  
Author(s):  
Laszlo Szilagyi ◽  
Guido Belfiore ◽  
Ronny Henker ◽  
Frank Ellinger
Keyword(s):  
Digital Cmos ◽  
28 Nm

Millimeter-Wave Low-Noise Amplifier Design in 28-nm Low-Power Digital CMOS

2015 ◽  
Vol 63 (6) ◽  
pp. 1910-1922 ◽  
Author(s):  
David Fritsche ◽  
Gregor Tretter ◽  
Corrado Carta ◽  
Frank Ellinger
Keyword(s):  
Low Power ◽  
Millimeter Wave ◽  
Low Noise ◽  
Low Noise Amplifier ◽  
Digital Cmos ◽  
Amplifier Design ◽  
Noise Amplifier ◽  
28 Nm

Multi-Gb/s OOK mm-wave modulator ICs on 28 nm low-power digital CMOS

2016 ◽  
Author(s):  
Jan Dirk Leufker ◽  
David Fritsche ◽  
Guido Belfiore ◽  
Corrado Carta ◽  
Frank Ellinger
Keyword(s):  
Low Power ◽  
Digital Cmos ◽  
28 Nm

Zero‐Ohm transmission lines for millimetre‐wave circuits in 28 nm digital CMOS

2015 ◽  
Vol 51 (11) ◽  
pp. 845-847 ◽  
Author(s):  
G. Tretter ◽  
D. Fritsche ◽  
J.D. Leufker ◽  
C. Carta ◽  
F. Ellinger
Keyword(s):  
Transmission Lines ◽  
Digital Cmos ◽  
Millimetre Wave ◽  
28 Nm

Design and Characterization of a 3-bit 24-GS/s Flash ADC in 28-nm Low-Power Digital CMOS

2016 ◽  
Vol 64 (4) ◽  
pp. 1143-1152 ◽  
Author(s):  
Gregor Tretter ◽  
Mohammad Mahdi Khafaji ◽  
David Fritsche ◽  
Corrado Carta ◽  
Frank Ellinger
Keyword(s):  
Low Power ◽  
Digital Cmos ◽  
Flash Adc ◽  
28 Nm

Combining Current Imaging, EBIC/EBAC, and Electrical Probing for Fast and Reliable In-Situ Electrical Fault Isolation

2016 ◽  
Author(s):  
Stephan Kleindiek ◽  
Matthias Kemmler ◽  
Andreas Rummel ◽  
Klaus Schock
Keyword(s):  
Imaging Technique ◽  
Fault Isolation ◽  
28 Nm

Abstract Using a compact nanoprobing setup comprising eight probe tips attached to piezo-driven micromanipulators, various techniques for fault isolation are performed on 28 nm samples inside an SEM. The recently implemented Current Imaging technique is used to quickly image large arrays of contacts providing a means of locating faults.

High Speed 1-tap Decision Feedback Equalizer in 28 nm CMOS

2014 ◽  
Vol 9 (9th) ◽  
pp. 1-12
Author(s):  
Mostafa Hosny ◽  
Sameh Ibrahim ◽  
DiaaEldin Khalil ◽  
Mohamed Dessouky
Keyword(s):  
High Speed ◽  
Decision Feedback ◽  
Decision Feedback Equalizer ◽  
28 Nm
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