Radar Broadband Signal High-precision On-line Testing Method

2021 ◽  
Author(s):  
Wang Ying ◽  
Wu Jie
Keyword(s):  
High Precision ◽  
Testing Method ◽  
Broadband Signal ◽  
On Line

Implementation for High-Precision and Non-Contact System for the Measurement of Crankshaft and Camshaft

2011 ◽  
Vol 301-303 ◽  
pp. 959-964 ◽  
Author(s):  
Da Lin Cheng ◽  
Yi Wang ◽  
Yong Jie Ren ◽  
Xue You Yang
Keyword(s):  
Standard Deviation ◽  
High Precision ◽  
Measurement System ◽  
General Structure ◽  
Contact System ◽  
Scanning Laser ◽  
Test Results ◽  
Line Measurement ◽  
On Line ◽  
High Depth

A novel crankshaft and camshaft measurement system by optoelectronic scanning of which a flat-crystal was used to generate high depth of parallelism scanning laser was implemented. The general structure and principle were given. Mass of test results showed that the system could achieve high precision. The ranges could achieve ±8μm, standard deviation could achieve 3μm, and easy to operate, work reliably, automatically and on line measurement could be implemented.

Research on the Measurement System of Large Dimension Workpieces Based on the Technology of CCD and Laser

2010 ◽  
Vol 37-38 ◽  
pp. 1101-1104
Author(s):  
Xiu Min Yang ◽  
Yan Wang ◽  
Wei Lun Zhao ◽  
Lei Zhang
Keyword(s):  
High Precision ◽  
Large Dimension ◽  
Measure Data ◽  
Single Chip ◽  
Single Chip Microcomputer ◽  
Ccd Sensor ◽  
Line Measurement ◽  
On Line ◽  
Geometry Error ◽  
Control Apparatus

A kind of the measurement technique of the dimension and the geometry error of large dimension workpiece with two light routes and two CCD sensors has been made. The mathematical models of the dimension and the geometry error based on the technology of CCD and laser are established. The application property parameter to measure workpiece dimension and geometry error and the design characteristic related supplemental hardware of CCD sensor are studied. An on-line data collection system based on laser and liner array CCD is developed. This systematic C8051 single-chip microcomputer as controler that adopt American CYGNAL company's production carry out handling and the collection of data. the system meets the measurement requirement of no-touch, on line and high precision with adopting of machine, laser and electricity comprehensive technology. The result can be got in this paper: the CCD sensor can meet the need of measuring dimension and geometry error of big workpiece and is no-touch, on line measurement and high precision. The on line collecting data system can achieve the expecting function, and measure data on line, and it also can easily connect with auto control apparatus.

scholarly journals Challenges in nanometrology: high precision measurement of position and size

2015 ◽  
Vol 82 (7-8) ◽  
Author(s):  
Harald Bosse ◽  
Bernd Bodermann ◽  
Gaoliang Dai ◽  
Jens Flügge ◽  
Carl G. Frase ◽  
...  
Keyword(s):  
High Precision ◽  
Precision Measurement ◽  
High Precision Measurement ◽  
Feature Size ◽  
Traceability Chain ◽  
Transmission Electron ◽  
Recent Approach ◽  
Recent Developments ◽  
On Line ◽  
Nanoscale Features

AbstractRecent developments of the PTB in high precision position and size metrology as support for different nanotechnology applications are described. Measurement uncertainties of 1–2 nm for 1D-position of graduation lines on photomasks, or on line scales and incremental encoders of about 300 mm length have been achieved. The measurement of the size of nanoscale features represents additional challenges, because the location of opposite feature edges needs to be precisely determined. Different feature size or CD metrology techniques are applied at PTB, including a recent approach which uses transmission electron microscopy in the traceability chain of AFM CD measurements. The estimated uncertainty for CD measurements on high quality Si line structures is

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