Compression/Scan Co-Design for Reducing Test Data Volume, Scan-in Power Dissipation and Test Application Time
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2006 ◽
Vol E89-D
(10)
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pp. 2616-2625
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2009 ◽
Vol E92-D
(7)
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pp. 1462-1465
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2012 ◽
Vol 35
(6)
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pp. 687-696
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