Capture in Turn Scan for Reduction of Test Data Volume, Test Application Time and Test Power

Author(s):  
Zhiqiang You ◽  
Jiedi Huang ◽  
Michiko Inoue ◽  
Jishun Kuang ◽  
Hideo Fujiwara
2009 ◽  
Vol E92-D (7) ◽  
pp. 1462-1465 ◽  
Author(s):  
Yongjoon KIM ◽  
Myung-Hoon YANG ◽  
Jaeseok PARK ◽  
Eunsei PARK ◽  
Sungho KANG

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