An Efficient Test Pattern Selection Method for Improving Defect Coverage with Reduced Test Data Volume and Test Application Time
Keyword(s):
2009 ◽
Vol E92-D
(7)
◽
pp. 1462-1465
◽
Keyword(s):
Keyword(s):
2012 ◽
Vol 35
(6)
◽
pp. 687-696
Keyword(s):
Keyword(s):
Keyword(s):
Keyword(s):