Image sharpness metrics for digital microscopy

2015 ◽  
Author(s):  
Gergely Windisch ◽  
Miklos Kozlovszky
Keyword(s):  
Digital Microscopy ◽  
Image Sharpness ◽  
Sharpness Metrics

scholarly journals A No-Reference Sharpness Metric Based on Structured Ringing for JPEG2000 Images

2014 ◽  
Vol 2014 ◽  
pp. 1-13 ◽  
Author(s):  
Zhipeng Cao ◽  
Zhenzhong Wei ◽  
Guangjun Zhang
Keyword(s):  
Edge Detection ◽  
Anisotropic Diffusion ◽  
Experimental Results ◽  
Reference Image ◽  
Image Sharpness ◽  
Ringing Artifacts ◽  
Sharpness Metric ◽  
Sharpness Metrics ◽  
Degraded Images

This work presents a no-reference image sharpness metric based on human blur perception for JPEG2000 compressed image. The metric mainly uses a ringing measure. And a blurring measure is used for compensation when the blur is so severe that ringing artifacts are concealed. We used the anisotropic diffusion for the preliminary ringing map and refined it by considering the property of ringing structure. The ringing detection of the proposed metric does not depend on edge detection, which is suitable for high degraded images. The characteristics of the ringing and blurring measures are analyzed and validated theoretically and experimentally. The performance of the proposed metric is tested and compared with that of some existing JPEG2000 sharpness metrics on three widely used databases. The experimental results show that the proposed metric is accurate and reliable in predicting the sharpness of JPEG2000 images.

Creating a standard method of controlling digital microscopes: the microscope access protocol (map)

1995 ◽  
Vol 53 ◽  
pp. 16-17
Author(s):  
T. A. Dodson ◽  
E. Völkl ◽  
L. F. Allard ◽  
T. A. Nolan
Keyword(s):  
Data Storage ◽  
Storage Systems ◽  
Digital Systems ◽  
Data Networks ◽  
Digital Microscopy ◽  
Command Language ◽  
Access Protocol ◽  
Analog To Digital ◽  
Basic Physics ◽  
Scanning Electron

The process of moving to a fully digital microscopy laboratory requires changes in instrumentation, computing hardware, computing software, data storage systems, and data networks, as well as in the operating procedures of each facility. Moving from analog to digital systems in the microscopy laboratory is similar to the instrumentation projects being undertaken in many scientific labs. A central problem of any of these projects is to create the best combination of hardware and software to effectively control the parameters of data collection and then to actually acquire data from the instrument. This problem is particularly acute for the microscopist who wishes to "digitize" the operation of a transmission or scanning electron microscope. Although the basic physics of each type of instrument and the type of data (images & spectra) generated by each are very similar, each manufacturer approaches automation differently. The communications interfaces vary as well as the command language used to control the instrument.

Use of digital microscopy in process control during the manufacture of rubber-modified thermoplastics

1996 ◽  
Vol 54 ◽  
pp. 616-617
Author(s):  
M. T. Dineen
Keyword(s):  
Ccd Camera ◽  
Operating Costs ◽  
Hard Copy ◽  
Production Plant ◽  
Digital Microscopy ◽  
Nih Image ◽  
Transmission Electron ◽  
Conventional Film ◽  
Product Loss ◽  
Image Collection

The production of rubber modified thermoplastics can exceed rates of 30,000 pounds per hour. If a production plant needs to equilibrate or has an upset, that means operating costs and lost revenue. Results of transmission electron microscopy (TEM) can be used for process adjustments to minimize product loss. Conventional TEM, however, is not a rapid turnaround technique. The TEM process was examined, and it was determined that 50% of the time it took to complete a polymer sample was related to film processing, even when using automated equipment. By replacing the conventional film portion of the process with a commercially available system to digitally acquire the TEM image, a production plant can have the same TEM image in the control room within 1.5 hours of sampling.A Hitachi H-600 TEM Operated at 100 kV with a tungsten filament was retrofitted with a SEMICAPS™ image collection and processing workstation and a KODAK MEGAPLUS™ charged coupled device (CCD) camera (Fig. 1). Media Cybernetics Image-Pro Plus software was included, and connections to a Phaser II SDX printer and the network were made. Network printers and other PC and Mac software (e.g. NIH Image) were available. By using digital acquisition and processing, the time it takes to produce a hard copy of a digital image is greatly reduced compared to the time it takes to process film.

SEM image sharpness analysis

1996 ◽  
Vol 54 ◽  
pp. 142-143
Author(s):  
M. T. Postek ◽  
A. E. Vladar
Keyword(s):  
High Frequency ◽  
Low Frequency ◽  
Quantitative Information ◽  
Primary Electron ◽  
Image Sharpness ◽  
Critical Dimensions ◽  
Sem Image ◽  
Frequency Changes ◽  
Electron Microscopes ◽  
Scanning Electron

Fully automated or semi-automated scanning electron microscopes (SEM) are now commonly used in semiconductor production and other forms of manufacturing. The industry requires that an automated instrument must be routinely capable of 5 nm resolution (or better) at 1.0 kV accelerating voltage for the measurement of nominal 0.25-0.35 micrometer semiconductor critical dimensions. Testing and proving that the instrument is performing at this level on a day-by-day basis is an industry need and concern which has been the object of a study at NIST and the fundamentals and results are discussed in this paper.In scanning electron microscopy, two of the most important instrument parameters are the size and shape of the primary electron beam and any image taken in a scanning electron microscope is the result of the sample and electron probe interaction. The low frequency changes in the video signal, collected from the sample, contains information about the larger features and the high frequency changes carry information of finer details. The sharper the image, the larger the number of high frequency components making up that image. Fast Fourier Transform (FFT) analysis of an SEM image can be employed to provide qualitiative and ultimately quantitative information regarding the SEM image quality.

scholarly journals Classification of endonasal HHT lesions using digital microscopy

2021 ◽  
Vol 16 (1) ◽  
Author(s):  
F. Haubner ◽  
A. Schneider ◽  
H. Schinke ◽  
M. Bertlich ◽  
B. G. Weiss ◽  
...  
Keyword(s):  
Quality Of Life ◽  
Treatment Modalities ◽  
Hereditary Haemorrhagic Telangiectasia ◽  
Digital Microscopy ◽  
Digital Microscope ◽  
Lower Severity ◽  
Gender Specific Differences ◽  
Vegf Level

Abstract Background Recurrent spontaneous epistaxis is the most common clinical manifestation and the most debilitating symptom in hereditary haemorrhagic telangiectasia (HHT) patients. To this date, there exist only a classification of HHT patients by different genetic mutations. There is no standard classification for the mucocutaneous endonasal manifestations of HHT. The aim of the present study was to document the variety of endonasal HHT lesions using digital microscopy and to propose a clinical classification. Methods We recorded the endonasal HHT lesions of 28 patients using a digital microscope. We reconstructed the 3D images und videos recorded by digital microscope afterwards and classified the endonasal lesions of HHT in two classes: Grade A, presence of only flat telangiectasias in the mucosa level and Grade B, (additional) presence of raised berry or wart-like telangiectasia spots. We investigated also Haemoglobin level by routine laboratory procedures, plasma VEGF level by ELISA, Severity of epistaxis by epistaxis severity score (ESS) and quality of life by a linear visual analogue scale (VAS). Results We found a higher quality of life and a lower severity of epistaxis in Grade A patients in comparison to Grade B patients. No difference in plasma VEGF level and in Haemoglobin between Grad A patients and Grade B patients could be detected. Plasma VEGF levels showed no gender specific differences. It could also not be correlated to the extranasal manifestation. Conclusion The classification for endonasal manifestation of HHT proposed in this study indicates severity of epistaxis und quality of life. Digital microscopy with the ability of 3D reconstruction of images presents a useful tool for such classifications. The classification of endonasal HHT lesions using digital microscopy allows to evaluate the dynamic of HHT lesions in the course of time independent of examiner. This allows also to evaluate the efficacy of the different treatment modalities by dynamic of HHT lesions. Moreover digital microscopy is very beneficial in academic teaching of rare diseases.

A Two-Stage Time-Domain Autofocus Method Based on Generalized Sharpness Metrics and AFBP

2021 ◽  
pp. 1-13
Author(s):  
Tao Zhang ◽  
Guisheng Liao ◽  
Yachao Li ◽  
Tong Gu ◽  
Tinghao Zhang ◽  
...  
Keyword(s):  
Time Domain ◽  
Two Stage ◽  
Sharpness Metrics

scholarly journals Suppressing meta-holographic artifacts by laser coherence tuning

2021 ◽  
Vol 10 (1) ◽  
Author(s):  
Yaniv Eliezer ◽  
Geyang Qu ◽  
Wenhong Yang ◽  
Yujie Wang ◽  
Hasan Yılmaz ◽  
...  
Keyword(s):  
Spatial Coherence ◽  
Fine Tuning ◽  
Total Power ◽  
Image Sharpness ◽  
Continuous Tuning ◽  
Fine Spatial Resolution ◽  
Compact Size ◽  
Wide Range ◽  
Fabrication Defects ◽  
Holographic Displays

AbstractA metasurface hologram combines fine spatial resolution and large viewing angles with a planar form factor and compact size. However, it suffers coherent artifacts originating from electromagnetic cross-talk between closely packed meta-atoms and fabrication defects of nanoscale features. Here, we introduce an efficient method to suppress all artifacts by fine-tuning the spatial coherence of illumination. Our method is implemented with a degenerate cavity laser, which allows a precise and continuous tuning of the spatial coherence over a wide range, with little variation in the emission spectrum and total power. We find the optimal degree of spatial coherence to suppress the coherent artifacts of a meta-hologram while maintaining the image sharpness. This work paves the way to compact and dynamical holographic displays free of coherent defects.

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