Suppression of Statistical Variability in Junctionless FinFET Using Accumulation-Mode and Charge Plasma Structure

IEEE Transactions on Electron Devices ◽

10.1109/ted.2020.3040137 ◽

2021 ◽

Vol 68 (1) ◽

pp. 399-404

Author(s):

Luodan Hu ◽

Haijun Lou ◽

Wentao Li ◽

Kuan-Chang Chang ◽

Xinnan Lin

Keyword(s):

Plasma Structure ◽

Accumulation Mode ◽

Charge Plasma ◽

Statistical Variability

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Variation Investigation of Junction-less Transistor with Side-wall Charge-plasma Structure Induced by Line Edge Roughness

2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict49897.2020.9278349 ◽

2020 ◽

Author(s):

Kai Liu ◽

Hung-Chih Chin ◽

Haijun Lou ◽

Kuan-Chang Chang ◽

Xinnan Lin

Keyword(s):

Side Wall ◽

Plasma Structure ◽

Line Edge Roughness ◽

Charge Plasma ◽

Edge Roughness ◽

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Strain Consideration of Charge Plasma Structure on Junctionless Transistor With Line Edge Roughness

2018 IEEE International Conference on Electron Devices and Solid State Circuits (EDSSC) ◽

10.1109/edssc.2018.8487066 ◽

2018 ◽

Author(s):

Wentao Li ◽

Haijun Lou ◽

Xinnan Lin

Keyword(s):

Plasma Structure ◽

Line Edge Roughness ◽

Charge Plasma ◽

Edge Roughness ◽

Junctionless Transistor

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Charge plasma technique based dopingless accumulation mode junctionless cylindrical surrounding gate MOSFET: analog performance improvement

Applied Physics A ◽

10.1007/s00339-017-1176-y ◽

2017 ◽

Vol 123 (9) ◽

Author(s):

Nitin Trivedi ◽

Manoj Kumar ◽

Subhasis Haldar ◽

S. S. Deswal ◽

Mridula Gupta ◽

...

Keyword(s):

Performance Improvement ◽

Accumulation Mode ◽

Charge Plasma ◽

Plasma Technique ◽

Analog Performance ◽

Surrounding Gate

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Accumulation-mode and inversion-mode triple-gate MOSFETs

China-Ireland International Conference on Information and Communications Technologies (CIICT 2008) ◽

10.1049/cp:20080883 ◽

2008 ◽

Author(s):

R. Yan ◽

A. Afzalian ◽

C.-W. Lee ◽

D.N. Akhavan ◽

W. Xiong ◽

...

Keyword(s):

Inversion Mode ◽

Accumulation Mode ◽

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2-D analytical modeling of drain and gate-leakage currents of cylindrical gate asymmetric halo doped dual material-junctionless accumulation mode MOSFET

AEU - International Journal of Electronics and Communications ◽

10.1016/j.aeue.2020.153071 ◽

2020 ◽

Vol 116 ◽

pp. 153071 ◽

Author(s):

Kamalaksha Baral ◽

Prince Kumar Singh ◽

Sanjay Kumar ◽

Ashish Singh ◽

Manas Tripathy ◽

...

Keyword(s):

Analytical Modeling ◽

Gate Leakage ◽

Leakage Currents ◽

Accumulation Mode ◽

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Charge trapping analysis in sputtered BixSe1-x based accumulation-mode FETs. II. Gate capacitance characteristics

AIP Advances ◽

10.1063/9.0000027 ◽

2021 ◽

Vol 11 (1) ◽

pp. 015221

Author(s):

Protyush Sahu ◽

Jun-Yang Chen ◽

Jian-Ping Wang

Keyword(s):

Charge Trapping ◽

Accumulation Mode ◽

Gate Capacitance ◽

Capacitance Characteristics

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Total ionizing dose effects in junctionless accumulation mode MOSFET

Applied Physics A ◽

10.1007/s00339-021-04313-2 ◽

2021 ◽

Vol 127 (3) ◽

Author(s):

Avashesh Dubey ◽

Rakhi Narang ◽

Manoj Saxena ◽

Mridula Gupta

Keyword(s):

Total Ionizing Dose ◽

Accumulation Mode ◽

Dose Effects ◽

Total Ionizing Dose Effects

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Very large photogain and high photorespone linearity of Ge-dot photoMOSFETs operating in accumulation-mode for monolithic Si photonics

2017 Silicon Nanoelectronics Workshop (SNW) ◽

10.23919/snw.2017.8242330 ◽

2017 ◽

Author(s):

Ming-Hao Kuo ◽

B. J. Liu ◽

T. L. Huang ◽

H. C. Lin ◽

Pei-Wen Li

Keyword(s):

Accumulation Mode ◽

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Indoor Sources of Ultrafine and Accumulation Mode Particles: Size Distributions, Size-Resolved Concentrations, and Source Strengths

Aerosol Science and Technology ◽

10.1080/02786820600612250 ◽

2006 ◽

Vol 40 (5) ◽

pp. 348-360 ◽

Author(s):

Lance Wallace

Keyword(s):

Size Distributions ◽

Accumulation Mode ◽

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Impact of statistical variability and 3D electrostatics on post-cycling anomalous charge loss in nanoscale Flash memories

2013 IEEE International Reliability Physics Symposium (IRPS) ◽

10.1109/irps.2013.6531980 ◽

2013 ◽

Author(s):

S. M. Amoroso ◽

L. Gerrer ◽

F. Adamu-Lema ◽

S. Markov ◽

A. Asenov

Keyword(s):

Flash Memories ◽

Charge Loss ◽

Statistical Variability

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