Aging Monitoring of Bond Wires Based on Differential Mode Conducted Interference Spectrum for IGBT Module

Author(s):  
Chengpeng Chu ◽  
Chao Dong ◽  
Mingxing Du ◽  
Xuesong Zhou ◽  
Ziwei Ouyang
2021 ◽  
Vol 36 (1) ◽  
pp. 888-897
Author(s):  
Kaihong Wang ◽  
Luowei Zhou ◽  
Pengju Sun ◽  
Xiong Du

2013 ◽  
Vol 53 (2) ◽  
pp. 282-287 ◽  
Author(s):  
Luowei Zhou ◽  
Shengqi Zhou ◽  
Mingwei Xu
Keyword(s):  

2017 ◽  
Vol 32 (5) ◽  
pp. 3777-3786 ◽  
Author(s):  
Pengju Sun ◽  
Can Gong ◽  
Xiong Du ◽  
Yingzhou Peng ◽  
Bo Wang ◽  
...  

Energies ◽  
2019 ◽  
Vol 12 (9) ◽  
pp. 1791 ◽  
Author(s):  
Qingyi Kong ◽  
Mingxing Du ◽  
Ziwei Ouyang ◽  
Kexin Wei ◽  
William Gerard Hurley

On-state voltage is an important thermal parameter for insulated gate bipolar transistor (IGBT) modules. It is employed widely to predict failure in IGBT module bond wires. However, due to restrictions in work environments and measurement methods, it is difficult to ensure the measurement accuracy for the on-state voltage under practical working conditions. To address this problem, an on-state voltage separation strategy is proposed for the IGBT modules with respect to the influence of collector current (Ic) and junction temperature (Tj). This method involves the separation of the on-state voltage into a dependent part and two independent parts during the IGBT module bond wire prediction. Based on the proposed separation strategy, the independent parts in the failure prediction can be removed, making it possible to directly monitor the voltage variations caused by bond wire failure. The experimental results demonstrate that the proposed diagnosis strategy can accurately predict the bond wire failure stage in an IGBT module under different conditions.


2018 ◽  
Vol 11 (2) ◽  
pp. 320-328 ◽  
Author(s):  
Yingzhou Peng ◽  
Luowei Zhou ◽  
Xiong Du ◽  
Pengju Sun ◽  
Kaihong Wang ◽  
...  

Electronics ◽  
2021 ◽  
Vol 10 (12) ◽  
pp. 1449
Author(s):  
Chuankun Wang ◽  
Yigang He ◽  
Yunfeng Jiang ◽  
Lie Li

Due to the constant changes of the environment and load, the insulated-gate bipolar transistor (IGBT) module is subjected to a large amount of junction temperature (Tj) fluctuations, which often leads to damage to the bond wires. The monitoring parameters of IGBTs are often coupled with Tj, which increases the difficulty of monitoring IGBTs’ health status online. In this paper, based on the collector current (Ic) and collector-emitter on-state voltage (Vce_on) online monitoring circuit, an online monitoring method of IGBT bond wire aging against interference is proposed. First, the bond wire aging model is established, and the Vce_on is selected as the monitoring parameter. Secondly, taking a three-phase inverter circuit as an example, the Vce_on and Ic waveforms of the IGBT module are monitored in real time, and the process of online monitoring is introduced accordingly. Finally, the experimental results indicate that the method proposed in this paper can accurately identify the aging state of IGBT bond wires under different conditions.


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