Board-level reliability of Pb-free solder joints of TSOP and various CSPs

2005 ◽  
Vol 28 (2) ◽  
pp. 168-175 ◽  
Author(s):  
Seung Wook Yoon ◽  
Jun Ki Hong ◽  
Hwa Jung Kim ◽  
Kwang Yoo Byun
Keyword(s):  
Solder Joints ◽  
Free Solder ◽  
Board Level ◽  
Board Level Reliability

Board-Level Reliability of Pb-Free Surface Mounted Assemblies during Thermal Shock Testing

2006 ◽  
Vol 15-17 ◽  
pp. 633-638 ◽  
Author(s):  
Jong Woong Kim ◽  
Hyun Suk Chun ◽  
Sang Su Ha ◽  
Jong Hyuck Chae ◽  
Jin Ho Joo ◽  
...  
Keyword(s):  
Thermal Shock ◽  
Solder Joints ◽  
Lead Frame ◽  
Shear Forces ◽  
Microstructural Investigation ◽  
Shock Testing ◽  
Ceramic Capacitor ◽  
Board Level ◽  
Board Level Reliability ◽  
Thermal Shocks

Board-level reliability of conventional Sn-37Pb and Pb-free Sn-3.0Ag-0.5Cu solder joints was evaluated using thermal shock testing. In the microstructural investigation of the solder joints, the formation of Cu6Sn5 intermetallic compound (IMC) layer was observed between both solders and Cu lead frame, but any crack or newly introduced defect cannot be found even after 2000 cycles of thermal shocks. Shear test of the multi layer ceramic capacitor (MLCC) joints were also conducted to investigate the effect of microstructural variations on the bonding strength of the solder joints. Shear forces of the both solder joints decreased with increasing thermal shock cycles. The reason to the decrease in shear force was discussed with fracture surfaces of the shear tested solder joints.

scholarly journals Improvement of Board Level Reliability for μBGA Solder Joints Using Underfill

2003 ◽  
Vol 44 (10) ◽  
pp. 2175-2179 ◽  
Author(s):  
Jong-Min Kim ◽  
Dave F. Farson ◽  
Young-Eui Shin
Keyword(s):  
Solder Joints ◽  
Board Level ◽  
Board Level Reliability

Experimental Evaluation on Solder Joint Reliability of PBGA Assembly Under Mechanical Drop Test

2002 ◽  
Author(s):  
Shi-Wei Ricky Lee ◽  
Yin-Lai Tracy Li ◽  
Hoi-Wai Ben Lui
Keyword(s):  
Solder Joint ◽  
Failure Modes ◽  
Solder Joints ◽  
Drop Test ◽  
Solder Joint Reliability ◽  
Joint Reliability ◽  
Free Solder ◽  
Board Level ◽  
Better Than ◽  
Mechanical Drop Test

The present study is intended to investigate the board level solder joint reliability of PBGA assemblies under mechanical drop test. During the course of this study, a five-leg experiment was designed to investigate various combinations of solder materials and peak reflow temperatures. Two major failure modes, namely, solder cracking and copper trace breakage, were identified. In addition, the critical location of solder joints was characterized. It was found that Sn-Pb eutectic solder joints performed better than Pb-free solder joints under mechanical impact loading.

scholarly journals Improved Reliability and Mechanical Performance of Ag Microalloyed Sn58Bi Solder Alloys

Metals ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 462 ◽  
Author(s):  
Guang Ren ◽  
Maurice N. Collins
Keyword(s):  
Mechanical Properties ◽  
Mechanical Performance ◽  
Temperature Cycling ◽  
Time To Failure ◽  
Solder Alloys ◽  
Hardening Mechanism ◽  
Solder Microstructure ◽  
Free Solder ◽  
Board Level ◽  
Board Level Reliability

Ag microalloyed Sn58Bi has been investigated in this study as a Pb-free solder candidate to be used in modern electronics industry in order to cope with the increasing demands for low temperature soldering. Microstructural and mechanical properties of the eutectic Sn58Bi and microalloyed Sn57.6Bi0.4Ag solder alloys were compared. With the addition of Ag microalloy, the tensile strength was improved, and this was attributed to a combination of microstructure refinement and an Ag3Sn precipitation hardening mechanism. However, ductility was slightly deteriorated due to the brittle nature of the Ag3Sn intermetallic compounds (IMCs). Additionally, a board level reliability study of Ag microalloyed Sn58Bi solder joints produced utilizing a surface-mount technology (SMT) process, were assessed under accelerated temperature cycling (ATC) conditions. Results revealed that microalloyed Sn57.6Bi0.4Ag had a higher characteristic lifetime with a narrower failure distribution. This enhanced reliability corresponds with improved bulk mechanical properties. It is postulated that Ag3Sn IMCs are located at the Sn–Bi phase boundaries and suppress the solder microstructure from coarsening during the temperature cycling, hereby extending the time to failure.

Modeling and Simulation of PCB Assembly under Board-Level Drop Impact

2010 ◽  
Vol 34-35 ◽  
pp. 451-455
Author(s):  
Fang Liu ◽  
Guang Meng
Keyword(s):  
Solder Joint ◽  
Printed Circuit Board ◽  
Solder Joints ◽  
Circuit Board ◽  
Fe Model ◽  
Fe Method ◽  
Acceleration Pulse ◽  
Pcb Assembly ◽  
Free Solder ◽  
Board Level

Finite element (FE) method is an efficient and power tool, and is adopted to analyze dynamic response of printed circuit board (PCB) assembly. First, FE model of PCB assembly was established. Second, the dynamic behaviors of ball gird array (BGA) lead-free solder joint were obtained when the PCB assembly was subjected to a half-sine acceleration pulse. Results show that the maximum tensile stresses occur at solder joints located at the four outermost corners of BGA and solder joints at outermost corners are the most vulnerable to crack. In addition, it can be found during FE analysis that the solder joint reliability can be enhanced as the PCB damping increases and input acceleration level reduces.

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